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Investigation of GaN-on-GaN vertical p-n diode with regrown p-GaN by metalorganic chemical vapor deposition
To mimic selective-area doping, p-GaN was regrown on an etched GaN surface on GaN substrates by metalorganic chemical vapor deposition. Vertical GaN-on-GaN p-n diodes were fabricated to investigate the effects of the etch-then-regrowth process on device performance. The crystal quality of the sample...
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Published in: | Applied physics letters 2018-12, Vol.113 (23) |
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container_title | Applied physics letters |
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creator | Fu, Kai Fu, Houqiang Liu, Hanxiao Alugubelli, Shanthan Reddy Yang, Tsung-Han Huang, Xuanqi Chen, Hong Baranowski, Izak Montes, Jossue Ponce, Fernando A. Zhao, Yuji |
description | To mimic selective-area doping, p-GaN was regrown on an etched GaN surface on GaN substrates by metalorganic chemical vapor deposition. Vertical GaN-on-GaN p-n diodes were fabricated to investigate the effects of the etch-then-regrowth process on device performance. The crystal quality of the sample after each epitaxial step was characterized by X-ray diffraction, where the etch-then-regrowth process led to a very slight increase in edge dislocations. A regrowth interfacial layer was clearly shown by transmission electron microscopy. Strong electroluminescence was observed with three emission peaks at 2.2 eV, 2.8 eV, and 3.0 eV. The forward current density increased slightly with increasing temperature, while the reverse current density was almost temperature independent indicating tunneling as the reverse transport mechanism. This result is very similar to the reported Zener tunnel diode comprising a high doping profile at the junction interface. High levels of silicon and oxygen concentrations were observed at the regrowth interface with a distribution width of ∼100 nm. This work provides valuable information on p-GaN regrowth and regrown GaN p-n diodes, which can serve as an important reference for developing selective doping for advanced GaN power electronics for high voltage and high power applications. |
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Vertical GaN-on-GaN p-n diodes were fabricated to investigate the effects of the etch-then-regrowth process on device performance. The crystal quality of the sample after each epitaxial step was characterized by X-ray diffraction, where the etch-then-regrowth process led to a very slight increase in edge dislocations. A regrowth interfacial layer was clearly shown by transmission electron microscopy. Strong electroluminescence was observed with three emission peaks at 2.2 eV, 2.8 eV, and 3.0 eV. The forward current density increased slightly with increasing temperature, while the reverse current density was almost temperature independent indicating tunneling as the reverse transport mechanism. This result is very similar to the reported Zener tunnel diode comprising a high doping profile at the junction interface. High levels of silicon and oxygen concentrations were observed at the regrowth interface with a distribution width of ∼100 nm. This work provides valuable information on p-GaN regrowth and regrown GaN p-n diodes, which can serve as an important reference for developing selective doping for advanced GaN power electronics for high voltage and high power applications.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.5052479</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Applied physics ; Chemical vapor deposition ; Current density ; Diodes ; Doping ; Edge dislocations ; Electroluminescence ; ENGINEERING ; Gallium nitrides ; High voltages ; Metalorganic chemical vapor deposition ; Organic chemistry ; Substrates ; Transmission electron microscopy ; Tunnel diodes ; X-ray diffraction</subject><ispartof>Applied physics letters, 2018-12, Vol.113 (23)</ispartof><rights>Author(s)</rights><rights>2018 Author(s). Published by AIP Publishing.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c389t-421a28c5ad0d9607ac0256f90f51daa08456c3ec3dd01cf70c07581d11be0ab83</citedby><cites>FETCH-LOGICAL-c389t-421a28c5ad0d9607ac0256f90f51daa08456c3ec3dd01cf70c07581d11be0ab83</cites><orcidid>0000-0003-3106-7542 ; 0000-0002-7085-4162 ; 0000-0002-1275-9386 ; 0000-0003-4963-7515 ; 0000-0002-1125-8328 ; 0000-0002-5071-1420 ; 0000000211258328 ; 0000000250711420 ; 0000000331067542 ; 0000000212759386 ; 0000000349637515 ; 0000000270854162</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.5052479$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,314,780,782,784,795,885,27924,27925,76383</link.rule.ids><backlink>$$Uhttps://www.osti.gov/servlets/purl/1505568$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Fu, Kai</creatorcontrib><creatorcontrib>Fu, Houqiang</creatorcontrib><creatorcontrib>Liu, Hanxiao</creatorcontrib><creatorcontrib>Alugubelli, Shanthan Reddy</creatorcontrib><creatorcontrib>Yang, Tsung-Han</creatorcontrib><creatorcontrib>Huang, Xuanqi</creatorcontrib><creatorcontrib>Chen, Hong</creatorcontrib><creatorcontrib>Baranowski, Izak</creatorcontrib><creatorcontrib>Montes, Jossue</creatorcontrib><creatorcontrib>Ponce, Fernando A.</creatorcontrib><creatorcontrib>Zhao, Yuji</creatorcontrib><creatorcontrib>Arizona State Univ., Tempe, AZ (United States)</creatorcontrib><title>Investigation of GaN-on-GaN vertical p-n diode with regrown p-GaN by metalorganic chemical vapor deposition</title><title>Applied physics letters</title><description>To mimic selective-area doping, p-GaN was regrown on an etched GaN surface on GaN substrates by metalorganic chemical vapor deposition. Vertical GaN-on-GaN p-n diodes were fabricated to investigate the effects of the etch-then-regrowth process on device performance. The crystal quality of the sample after each epitaxial step was characterized by X-ray diffraction, where the etch-then-regrowth process led to a very slight increase in edge dislocations. A regrowth interfacial layer was clearly shown by transmission electron microscopy. Strong electroluminescence was observed with three emission peaks at 2.2 eV, 2.8 eV, and 3.0 eV. The forward current density increased slightly with increasing temperature, while the reverse current density was almost temperature independent indicating tunneling as the reverse transport mechanism. This result is very similar to the reported Zener tunnel diode comprising a high doping profile at the junction interface. High levels of silicon and oxygen concentrations were observed at the regrowth interface with a distribution width of ∼100 nm. This work provides valuable information on p-GaN regrowth and regrown GaN p-n diodes, which can serve as an important reference for developing selective doping for advanced GaN power electronics for high voltage and high power applications.</description><subject>Applied physics</subject><subject>Chemical vapor deposition</subject><subject>Current density</subject><subject>Diodes</subject><subject>Doping</subject><subject>Edge dislocations</subject><subject>Electroluminescence</subject><subject>ENGINEERING</subject><subject>Gallium nitrides</subject><subject>High voltages</subject><subject>Metalorganic chemical vapor deposition</subject><subject>Organic chemistry</subject><subject>Substrates</subject><subject>Transmission electron microscopy</subject><subject>Tunnel diodes</subject><subject>X-ray diffraction</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp90M1OAyEUBWBiNLFWF74B0ZUmU-8dhvlZmkarSaMbXRMKTIu2MDLTNr69TGt0YeLqBvJxgEPIOcIIIWc3OOLA06yoDsgAoSgShlgekgEAsCSvOB6Tk7Z9i0ueMjYg749uY9rOzmVnvaO-phP5lHiXxEE3JnRWySVtEke19drQre0WNJh58FsXt3s1-6Qr08mlD3PprKJqYVa7UxvZ-EC1aXxr-_RTclTLZWvOvueQvN7fvYwfkunz5HF8O00UK6suyVKUaam41KCrHAqpIOV5XUHNUUsJZcZzxYxiWgOqugAFBS9RI84MyFnJhuRin-vjx0SrbGfUQnnnjOoExn543qPLPWqC_1jHCsSbXwcX3yVSzEqWZrzAqK72SgXftsHUogl2JcOnQBB94QLFd-HRXu9tf-Ouzh-88eEXikbX_-G_yV_Z943o</recordid><startdate>20181203</startdate><enddate>20181203</enddate><creator>Fu, Kai</creator><creator>Fu, Houqiang</creator><creator>Liu, Hanxiao</creator><creator>Alugubelli, Shanthan Reddy</creator><creator>Yang, Tsung-Han</creator><creator>Huang, Xuanqi</creator><creator>Chen, Hong</creator><creator>Baranowski, Izak</creator><creator>Montes, Jossue</creator><creator>Ponce, Fernando A.</creator><creator>Zhao, Yuji</creator><general>American Institute of Physics</general><general>American Institute of Physics (AIP)</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>OIOZB</scope><scope>OTOTI</scope><orcidid>https://orcid.org/0000-0003-3106-7542</orcidid><orcidid>https://orcid.org/0000-0002-7085-4162</orcidid><orcidid>https://orcid.org/0000-0002-1275-9386</orcidid><orcidid>https://orcid.org/0000-0003-4963-7515</orcidid><orcidid>https://orcid.org/0000-0002-1125-8328</orcidid><orcidid>https://orcid.org/0000-0002-5071-1420</orcidid><orcidid>https://orcid.org/0000000211258328</orcidid><orcidid>https://orcid.org/0000000250711420</orcidid><orcidid>https://orcid.org/0000000331067542</orcidid><orcidid>https://orcid.org/0000000212759386</orcidid><orcidid>https://orcid.org/0000000349637515</orcidid><orcidid>https://orcid.org/0000000270854162</orcidid></search><sort><creationdate>20181203</creationdate><title>Investigation of GaN-on-GaN vertical p-n diode with regrown p-GaN by metalorganic chemical vapor deposition</title><author>Fu, Kai ; Fu, Houqiang ; Liu, Hanxiao ; Alugubelli, Shanthan Reddy ; Yang, Tsung-Han ; Huang, Xuanqi ; Chen, Hong ; Baranowski, Izak ; Montes, Jossue ; Ponce, Fernando A. ; Zhao, Yuji</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c389t-421a28c5ad0d9607ac0256f90f51daa08456c3ec3dd01cf70c07581d11be0ab83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Applied physics</topic><topic>Chemical vapor deposition</topic><topic>Current density</topic><topic>Diodes</topic><topic>Doping</topic><topic>Edge dislocations</topic><topic>Electroluminescence</topic><topic>ENGINEERING</topic><topic>Gallium nitrides</topic><topic>High voltages</topic><topic>Metalorganic chemical vapor deposition</topic><topic>Organic chemistry</topic><topic>Substrates</topic><topic>Transmission electron microscopy</topic><topic>Tunnel diodes</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Fu, Kai</creatorcontrib><creatorcontrib>Fu, Houqiang</creatorcontrib><creatorcontrib>Liu, Hanxiao</creatorcontrib><creatorcontrib>Alugubelli, Shanthan Reddy</creatorcontrib><creatorcontrib>Yang, Tsung-Han</creatorcontrib><creatorcontrib>Huang, Xuanqi</creatorcontrib><creatorcontrib>Chen, Hong</creatorcontrib><creatorcontrib>Baranowski, Izak</creatorcontrib><creatorcontrib>Montes, Jossue</creatorcontrib><creatorcontrib>Ponce, Fernando A.</creatorcontrib><creatorcontrib>Zhao, Yuji</creatorcontrib><creatorcontrib>Arizona State Univ., Tempe, AZ (United States)</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV - Hybrid</collection><collection>OSTI.GOV</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Fu, Kai</au><au>Fu, Houqiang</au><au>Liu, Hanxiao</au><au>Alugubelli, Shanthan Reddy</au><au>Yang, Tsung-Han</au><au>Huang, Xuanqi</au><au>Chen, Hong</au><au>Baranowski, Izak</au><au>Montes, Jossue</au><au>Ponce, Fernando A.</au><au>Zhao, Yuji</au><aucorp>Arizona State Univ., Tempe, AZ (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Investigation of GaN-on-GaN vertical p-n diode with regrown p-GaN by metalorganic chemical vapor deposition</atitle><jtitle>Applied physics letters</jtitle><date>2018-12-03</date><risdate>2018</risdate><volume>113</volume><issue>23</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>To mimic selective-area doping, p-GaN was regrown on an etched GaN surface on GaN substrates by metalorganic chemical vapor deposition. Vertical GaN-on-GaN p-n diodes were fabricated to investigate the effects of the etch-then-regrowth process on device performance. The crystal quality of the sample after each epitaxial step was characterized by X-ray diffraction, where the etch-then-regrowth process led to a very slight increase in edge dislocations. A regrowth interfacial layer was clearly shown by transmission electron microscopy. Strong electroluminescence was observed with three emission peaks at 2.2 eV, 2.8 eV, and 3.0 eV. The forward current density increased slightly with increasing temperature, while the reverse current density was almost temperature independent indicating tunneling as the reverse transport mechanism. This result is very similar to the reported Zener tunnel diode comprising a high doping profile at the junction interface. High levels of silicon and oxygen concentrations were observed at the regrowth interface with a distribution width of ∼100 nm. This work provides valuable information on p-GaN regrowth and regrown GaN p-n diodes, which can serve as an important reference for developing selective doping for advanced GaN power electronics for high voltage and high power applications.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.5052479</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0003-3106-7542</orcidid><orcidid>https://orcid.org/0000-0002-7085-4162</orcidid><orcidid>https://orcid.org/0000-0002-1275-9386</orcidid><orcidid>https://orcid.org/0000-0003-4963-7515</orcidid><orcidid>https://orcid.org/0000-0002-1125-8328</orcidid><orcidid>https://orcid.org/0000-0002-5071-1420</orcidid><orcidid>https://orcid.org/0000000211258328</orcidid><orcidid>https://orcid.org/0000000250711420</orcidid><orcidid>https://orcid.org/0000000331067542</orcidid><orcidid>https://orcid.org/0000000212759386</orcidid><orcidid>https://orcid.org/0000000349637515</orcidid><orcidid>https://orcid.org/0000000270854162</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Applied physics Chemical vapor deposition Current density Diodes Doping Edge dislocations Electroluminescence ENGINEERING Gallium nitrides High voltages Metalorganic chemical vapor deposition Organic chemistry Substrates Transmission electron microscopy Tunnel diodes X-ray diffraction |
title | Investigation of GaN-on-GaN vertical p-n diode with regrown p-GaN by metalorganic chemical vapor deposition |
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