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Investigation of GaN-on-GaN vertical p-n diode with regrown p-GaN by metalorganic chemical vapor deposition

To mimic selective-area doping, p-GaN was regrown on an etched GaN surface on GaN substrates by metalorganic chemical vapor deposition. Vertical GaN-on-GaN p-n diodes were fabricated to investigate the effects of the etch-then-regrowth process on device performance. The crystal quality of the sample...

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Published in:Applied physics letters 2018-12, Vol.113 (23)
Main Authors: Fu, Kai, Fu, Houqiang, Liu, Hanxiao, Alugubelli, Shanthan Reddy, Yang, Tsung-Han, Huang, Xuanqi, Chen, Hong, Baranowski, Izak, Montes, Jossue, Ponce, Fernando A., Zhao, Yuji
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cited_by cdi_FETCH-LOGICAL-c389t-421a28c5ad0d9607ac0256f90f51daa08456c3ec3dd01cf70c07581d11be0ab83
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container_issue 23
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container_title Applied physics letters
container_volume 113
creator Fu, Kai
Fu, Houqiang
Liu, Hanxiao
Alugubelli, Shanthan Reddy
Yang, Tsung-Han
Huang, Xuanqi
Chen, Hong
Baranowski, Izak
Montes, Jossue
Ponce, Fernando A.
Zhao, Yuji
description To mimic selective-area doping, p-GaN was regrown on an etched GaN surface on GaN substrates by metalorganic chemical vapor deposition. Vertical GaN-on-GaN p-n diodes were fabricated to investigate the effects of the etch-then-regrowth process on device performance. The crystal quality of the sample after each epitaxial step was characterized by X-ray diffraction, where the etch-then-regrowth process led to a very slight increase in edge dislocations. A regrowth interfacial layer was clearly shown by transmission electron microscopy. Strong electroluminescence was observed with three emission peaks at 2.2 eV, 2.8 eV, and 3.0 eV. The forward current density increased slightly with increasing temperature, while the reverse current density was almost temperature independent indicating tunneling as the reverse transport mechanism. This result is very similar to the reported Zener tunnel diode comprising a high doping profile at the junction interface. High levels of silicon and oxygen concentrations were observed at the regrowth interface with a distribution width of ∼100 nm. This work provides valuable information on p-GaN regrowth and regrown GaN p-n diodes, which can serve as an important reference for developing selective doping for advanced GaN power electronics for high voltage and high power applications.
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subjects Applied physics
Chemical vapor deposition
Current density
Diodes
Doping
Edge dislocations
Electroluminescence
ENGINEERING
Gallium nitrides
High voltages
Metalorganic chemical vapor deposition
Organic chemistry
Substrates
Transmission electron microscopy
Tunnel diodes
X-ray diffraction
title Investigation of GaN-on-GaN vertical p-n diode with regrown p-GaN by metalorganic chemical vapor deposition
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