Unusual types of extended defects in synthetic high pressure-high temperature diamonds

New unusual types of extended defects resembling bunches of divergent dislocations are observed in high quality synthetic HPHT single crystal diamonds grown at the lowest possible PT-conditions. Thorough characterisation of the samples by X-ray topotomography, optical microscopy and vibrational spec...

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Bibliographic Details
Published in:CrystEngComm 2018, Vol.2 (47), p.77-775
Main Authors: Shiryaev, Andrey A, Zolotov, Denis A, Suprun, Olena M, Ivakhnenko, Sergei A, Averin, Alexey A, Buzmakov, Alexey V, Lysakovskyi, Valentin V, Dyachkova, Irina G, Asadchikov, Victor E
Format: Article
Language:English
Subjects:
Crystal defects
Crystal growth
Defects
Diamonds
Dislocations
Grain boundaries
High temperature
Nonmetallic inclusions
Optical microscopy
Single crystals
X ray spectra
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Summary:New unusual types of extended defects resembling bunches of divergent dislocations are observed in high quality synthetic HPHT single crystal diamonds grown at the lowest possible PT-conditions. Thorough characterisation of the samples by X-ray topotomography, optical microscopy and vibrational spectroscopy allowed the conclusion that these defects are related to dislocations decorated by oxide inclusions. An unusual feature of the defects is their origin: small-angle grain boundaries formed during growth instabilities. Although similar defects were observed in some isostructural materials, their presence in diamonds was not reported earlier. Side view of a HPHT diamond with unusual cone-like defects and the high magnification image of the defect.
ISSN:1466-8033
1466-8033
DOI:10.1039/c8ce01499j