Detection of nonmagnetic metal thin film using magnetic force microscopy

Magnetic force microscopy (MFM) allows detection of stray magnetic fields around magnetic materials and the two-dimensional visualization of these fields. This paper presents a theoretical analysis of the oscillations of an MFM tip above a thin film of nonmagnetic metal. The results show good agreem...

Full description

Saved in:
Bibliographic Details
Published in:arXiv.org 2018-12
Main Authors: Wakaya, Fujio, Oosawa, Kenta, Kajiwara, Masahiro, Abo, Satoshi, Takai, Mikio
Format: Article
Language:English
Subjects:
Magnetic fields
Magnetic force microscopy
Magnetic materials
Magnetic resonance
Magnetism
Microscopy
Thin films
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Magnetic force microscopy (MFM) allows detection of stray magnetic fields around magnetic materials and the two-dimensional visualization of these fields. This paper presents a theoretical analysis of the oscillations of an MFM tip above a thin film of nonmagnetic metal. The results show good agreement with experimental data obtained by varying the tip height. The phenomenon analyzed here can be applied as a "metal detector" at the nanometer scale and for contactless measurement of sheet resistivity. The detection sensitivity is obtained as a function of oscillation frequency, thus allowing determination of the best frequency for phase-shift measurement. The shift in resonance frequency due to the presence of a nonmagnetic metal is also discussed.
ISSN:2331-8422
DOI:10.48550/arxiv.1812.03270