Accurate characterization of next-generation thin-film photodetectors

The performance of photodetectors fabricated from emerging semiconductors such as perovskites, quantum dots, two-dimensional materials or organics, for example, can be prone to misinterpretation. This Comment exposes the problems and proposes some guidelines for accurate characterization.

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Bibliographic Details
Published in:Nature photonics 2019-01, Vol.13 (1), p.1-4
Main Authors: Fang, Yanjun, Armin, Ardalan, Meredith, Paul, Huang, Jinsong
Format: Article
Language:English
Subjects:
639/624/1075/401
Applied and Technical Physics
Comment
Perovskites
Photometers
Physics
Physics and Astronomy
Quantum dots
Quantum Physics
Thin films
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Description
Summary:The performance of photodetectors fabricated from emerging semiconductors such as perovskites, quantum dots, two-dimensional materials or organics, for example, can be prone to misinterpretation. This Comment exposes the problems and proposes some guidelines for accurate characterization.
ISSN:1749-4885
1749-4893
DOI:10.1038/s41566-018-0288-z