Secondary Electron and Negative-Ion Emission from Metal Surface under the Bombardment by Positive Ions (H+, Cl+, HCl+)

A trap for positive ions (H + , Cl + , HCl + ) is created within a time-of-flight mass spectrometer. The yields of secondary electrons and negative ions (HCl − , H − ) formed due to forward and backward scattering of positive ions by steel wire at different kinetic energies (200–750 eV) are measured...

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Bibliographic Details
Published in:Bulletin of the Lebedev Physics Institute 2018-10, Vol.45 (10), p.303-307
Main Authors: Chichinin, A. I., Poretskiy, M., Maul, C., Gericke, K.-H.
Format: Article
Language:English
Subjects:
Electron bombardment
Ion bombardment
Ion emission
Ions
Metal surfaces
Negative ions
Physics
Physics and Astronomy
Positive ions
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Summary:A trap for positive ions (H + , Cl + , HCl + ) is created within a time-of-flight mass spectrometer. The yields of secondary electrons and negative ions (HCl − , H − ) formed due to forward and backward scattering of positive ions by steel wire at different kinetic energies (200–750 eV) are measured.
ISSN:1068-3356
1934-838X
DOI:10.3103/S1068335618100044