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A Yoffe-type moving crack in one-dimensional hexagonal piezoelectric quasicrystals

•Moving crack in 1D hexagonal piezoelectric quasicrystals is studied.•Full electroelastic field induced by a running crack is obtained.•Field intensity factor is independent of the crack speed.•Energy release rate is dependent on the crack speed.•Crack bifurcation is judged by the maximum energy rel...

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Bibliographic Details
Published in:Applied Mathematical Modelling 2019-01, Vol.65, p.148-163
Main Authors: Zhou, Y.-B., Li, X.-F.
Format: Article
Language:English
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Summary:•Moving crack in 1D hexagonal piezoelectric quasicrystals is studied.•Full electroelastic field induced by a running crack is obtained.•Field intensity factor is independent of the crack speed.•Energy release rate is dependent on the crack speed.•Crack bifurcation is judged by the maximum energy release rate. A Yoffe-type moving crack in one-dimensional hexagonal piezoelectric quasicrystals is considered. The Fourier transform technique is used to solve a moving crack problem under the action of antiplane shear and inplane electric field. Full elastic stresses of phonon and phason fields and electric fields are derived for a crack running with constant speed in the periodic plane. Obtained results show that the coupled elastic fields inside piezoelectric quasicrystals depend on the speed of crack propagation, and exhibit the usual square-root singularity at the moving crack tip. Electric field and phason stresses do not have singularity and electric displacement and phonon stresses have the inverse square-root singularity at the crack tip for a permeable crack. The field intensity factors and energy release rates are obtained in closed form. The crack velocity does not affect the field intensity factors, but alters the dynamic energy release rate. Bifurcation angle of a moving crack in a 1D hexagonal piezoelectric quasicrystal is evaluated from the viewpoint of energy balance. Obtained results are helpful to better understanding crack advance in piezoelectric quasicrystals.
ISSN:0307-904X
1088-8691
0307-904X
DOI:10.1016/j.apm.2018.08.005