EBSD Characterization of Specific Microstructures in RE-BCO Superconductors

Using the electron backscatter diffraction (EBSD) technique, we analyze in this contribution the microstructure of YBa 2 Cu 3 O x (YBCO) thick films with embedded a-axis oriented grains. The YBCO films were prepared by liquid phase epitaxy in air using NdGaO 3 substrates. Using this technique, a/c-g...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2019-04, Vol.29 (3), p.1-4
Main Authors: Koblischka-Veneva, Anjela, Koblischka, Michael R., Schmauch, Jorg, Wan, Y., Qian, J., Yao, Xin
Format: Article
Language:English
Subjects:
a-axis-oriented grains
Crystals
Diffraction
Electron backscatter diffraction
electron backscatter diffraction (EBSD)
Film growth
Grain boundaries
Grain orientation
Image color analysis
Image quality
Liquid phase epitaxy
Liquid phases
microstructure
Misalignment
Software
Substrates
Superconducting magnets
Thick films
YBa2Cu3Ox (YBCO)
YBCO superconductors
Yttrium barium copper oxide
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Summary:Using the electron backscatter diffraction (EBSD) technique, we analyze in this contribution the microstructure of YBa 2 Cu 3 O x (YBCO) thick films with embedded a-axis oriented grains. The YBCO films were prepared by liquid phase epitaxy in air using NdGaO 3 substrates. Using this technique, a/c-grain boundaries (GBs) with a well-defined facet of the YBCO film characterized by a single crystalline nature are obtained. This type of GB is very important for the basic physics of GBs in high-T c superconductor materials, and will contribute to a better understanding of GBs also in bulk materials. The application of EBSD to the analysis of a/c-GBs in YBCO requires a high Kikuchi pattern quality (i.e., image quality) to enable a proper distinction of the orientation, as the a-axis corresponds to about one-third of the c-axis, which can cause a misinterpretation of the resulting data. Having solved this problem, the EBSD-based determination of the GB misorientation angles directly proof the specific grain orientation achieved in the film growth.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2018.2880173