Effects of SrTiO^sub 3^ substrate orientations on crystal and domain structures and electric properties of NaNbO^sub 3^–SrZrO^sub 3^ films

• Published in: Japanese Journal of Applied Physics 2018-11, Vol.57 (11), p.11UF13
• Main Authors: Fujii, Ichiro, Shimasaki, Takayuki, Nobe, Toshiki, Adachi, Hideaki, Wada, Takahiro
• Format: Article
• Language: English
• Subjects: Antiferroelectricity; Crystal structure; Dielectric properties; Domains; Electric fields; Electric properties; Ferroelectric materials; Mapping; Morphology; Permittivity; Pulsed laser deposition; Pulsed lasers; Strontium titanates; Substrates
• ISSN: 0021-4922; 1347-4065
• DOI: 10.7567/JJAP.57.11UF13

0.92NaNbO3–0.08SrZrO3 films were grown on SrRuO3/(001) and (110) SrTiO3 substrates by pulsed laser deposition. SEM observation showed that the films on the SrRuO3-coated (001) and (110) SrTiO3 substrates had flat and stripe like surface morphologies and thicknesses of 0.4 and 0.7 µm, respectively. X-ray reciprocal space mapping indicated that both films had antiferroelectric domains. The dielectric constant of 180 and the tan δ of 0.02 for the film grown on the SrRuO3/(001) SrTiO3 substrate and the dielectric constant of 300 and the tan δ of 0.04 for the film grown on the SrRuO3/(110) SrTiO3 substrate were observed. Polarization–electric field (P–E) responses were ferroelectric and antiferroelectric for the films grown on the SrRuO3/(001) and (110) SrTiO3 substrates, respectively. The differences in the dielectric properties and P–E responses of the films were discussed with emphasis on their domain configurations.