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Molecular Imaging Secondary Ion Mass Spectrometry for the Characterization of Patterned Self-Assembled Monolayers on Silver and Gold
A study used secondary ion mass spectrometry (SIMS) to characterize methods of producing micrometer spatial scale patterns of two chemically distinct monolayers on silver and gold surfaces. SIMS allowed unambiguous confirmation of the correct fabrication of a molecular pattern with micrometer spatia...
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Published in: | Analytical chemistry (Washington) 1994-07, Vol.66 (13), p.2170-2174 |
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container_end_page | 2174 |
container_issue | 13 |
container_start_page | 2170 |
container_title | Analytical chemistry (Washington) |
container_volume | 66 |
creator | Gillen, Greg Bennett, Joe Tarlov, Michael J. Burgess, Donald R. F. |
description | A study used secondary ion mass spectrometry (SIMS) to characterize methods of producing micrometer spatial scale patterns of two chemically distinct monolayers on silver and gold surfaces. SIMS allowed unambiguous confirmation of the correct fabrication of a molecular pattern with micrometer spatial scale resolution. |
doi_str_mv | 10.1021/ac00085a036 |
format | article |
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F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Molecular Imaging Secondary Ion Mass Spectrometry for the Characterization of Patterned Self-Assembled Monolayers on Silver and Gold</atitle><jtitle>Analytical chemistry (Washington)</jtitle><addtitle>Anal. Chem</addtitle><date>1994-07-01</date><risdate>1994</risdate><volume>66</volume><issue>13</issue><spage>2170</spage><epage>2174</epage><pages>2170-2174</pages><issn>0003-2700</issn><eissn>1520-6882</eissn><coden>ANCHAM</coden><abstract>A study used secondary ion mass spectrometry (SIMS) to characterize methods of producing micrometer spatial scale patterns of two chemically distinct monolayers on silver and gold surfaces. SIMS allowed unambiguous confirmation of the correct fabrication of a molecular pattern with micrometer spatial scale resolution.</abstract><cop>Washington, DC</cop><pub>American Chemical Society</pub><doi>10.1021/ac00085a036</doi><tpages>5</tpages></addata></record> |
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ispartof | Analytical chemistry (Washington), 1994-07, Vol.66 (13), p.2170-2174 |
issn | 0003-2700 1520-6882 |
language | eng |
recordid | cdi_proquest_journals_217854501 |
source | ACS CRKN Legacy Archives |
subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Gold Ions Physics Scientific imaging Silver Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology |
title | Molecular Imaging Secondary Ion Mass Spectrometry for the Characterization of Patterned Self-Assembled Monolayers on Silver and Gold |
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