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Molecular Imaging Secondary Ion Mass Spectrometry for the Characterization of Patterned Self-Assembled Monolayers on Silver and Gold

A study used secondary ion mass spectrometry (SIMS) to characterize methods of producing micrometer spatial scale patterns of two chemically distinct monolayers on silver and gold surfaces. SIMS allowed unambiguous confirmation of the correct fabrication of a molecular pattern with micrometer spatia...

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Published in:Analytical chemistry (Washington) 1994-07, Vol.66 (13), p.2170-2174
Main Authors: Gillen, Greg, Bennett, Joe, Tarlov, Michael J., Burgess, Donald R. F.
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Language:English
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container_issue 13
container_start_page 2170
container_title Analytical chemistry (Washington)
container_volume 66
creator Gillen, Greg
Bennett, Joe
Tarlov, Michael J.
Burgess, Donald R. F.
description A study used secondary ion mass spectrometry (SIMS) to characterize methods of producing micrometer spatial scale patterns of two chemically distinct monolayers on silver and gold surfaces. SIMS allowed unambiguous confirmation of the correct fabrication of a molecular pattern with micrometer spatial scale resolution.
doi_str_mv 10.1021/ac00085a036
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ispartof Analytical chemistry (Washington), 1994-07, Vol.66 (13), p.2170-2174
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language eng
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source ACS CRKN Legacy Archives
subjects Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Gold
Ions
Physics
Scientific imaging
Silver
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
title Molecular Imaging Secondary Ion Mass Spectrometry for the Characterization of Patterned Self-Assembled Monolayers on Silver and Gold
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