X-ray optics and beam characterization using random modulation: Theory

X-ray near-field speckle-based phase-sensing approaches provide efficient means to characterise optical elements. Here, we present a theoretical review of several of these speckle methods in the frame of optical characterisation and provide a generalization of the concept. As we also demonstrate exp...

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Bibliographic Details
Published in:arXiv.org 2020-03
Main Authors: Berujon, Sebastien, Cojocaru, Ruxandra, Piault, Pierre, Celestre, Rafael, Roth, Thomas, Barrett, Raymond, Ziegler, Eric
Format: Article
Language:English
Subjects:
Beams (radiation)
Optical components
Optics
Production methods
X ray optics
Online Access:Get full text
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Summary:X-ray near-field speckle-based phase-sensing approaches provide efficient means to characterise optical elements. Here, we present a theoretical review of several of these speckle methods in the frame of optical characterisation and provide a generalization of the concept. As we also demonstrate experimentally in another paper, the methods theoretically developed here can be applied with different beams and optics and within a variety of situations where at-wavelength metrology is desired. By understanding the differences between the various processing methods, it is possible to find and implement the best suited approach for each metrology scenario.
ISSN:2331-8422
DOI:10.48550/arxiv.1902.09418