Sb2Te3 topological insulator: surface plasmon resonance and application in refractive index monitoring

Topological insulators as new emerging building blocks in electronics and photonics present promising prospects for exciting surface plasmons and enhancing light–matter interaction. Thus, exploring the visible-range plasmonic response of topological insulators is significant to reveal their optical...

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Bibliographic Details
Published in:Nanoscale 2019-03, Vol.11 (11), p.4759-4766
Main Authors: Lu, Hua, Dai, Siqing, Zengji Yue, Fan, Yicun, Cheng, Huachao, Jianglei Di, Mao, Dong, Li, Enpu, Ting Mei, Zhao, Jianlin
Format: Article
Language:English
Subjects:
Angle of reflection
Antimony
Antimony telluride
Digital imaging
Excitation
Holographic interferometry
Incident light
Light reflection
Monitoring
Optical properties
Permittivity
Photonics
Plasmons
Rangefinding
Refractivity
Surface plasmon resonance
Topological insulators
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Summary:Topological insulators as new emerging building blocks in electronics and photonics present promising prospects for exciting surface plasmons and enhancing light–matter interaction. Thus, exploring the visible-range plasmonic response of topological insulators is significant to reveal their optical characteristics and broaden their applications at high frequencies. Herein, we report the experimental demonstration of a visible-range surface plasmon resonance (SPR) effect on an antimony telluride (Sb2Te3) topological insulator film. The results show that the SPR can be excited with a relatively small incident angle in the Kretschmann configuration based on the Sb2Te3 film. Especially, we develop an impactful digital holographic imaging system based on the topological insulator SPR and realize the dynamic monitoring of refractive index variation. Compared with the traditional SPR, the Sb2Te3-based SPR possesses a broader measurement range. Our findings open a new avenue for exploring the optical physics and practical applications of topological insulators, such as environmental and biochemical sensing.
ISSN:2040-3364
2040-3372
DOI:10.1039/c8nr09227c