Three Dimensional Laser-assisted Atom-probe Tomography: Advanced Analysis of Si Nanostructures

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

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Bibliographic Details
Published in:Microscopy and microanalysis 2006-08, Vol.12 (S02), p.1738-1739
Main Authors: Thompson, K, Larson, DJ, Bunton, JH, Ulfig, RM, Prosa, TJ, Sebastian, JT, Lenz, DR, Gerstl, SS A, Reinhard, DA, Olson, JD, Kelly, TF
Format: Article
Language:English
Subjects:
Atom Probe Field Ion Microscopy
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927606065421