Ion Beam Irradiation Damage on poly(3-hexylthiophene) (P3HT) Based Organic Optoelectronic Devices: Can Cryo-FIB Help?

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

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Bibliographic Details
Published in:Microscopy and microanalysis 2007-08, Vol.13 (S02), p.1502-1503
Main Authors: Meltem, S, M., N Philipp, Stephan, M, Boril, C, Evelin, F, Peter, P, Elena, T, Werner, G, Harald, P, J.W., L Emil
Format: Article
Language:English
Subjects:
FIB Instrumentation and Application Advances for Physical and Biological Sciences
Irradiation
Online Access:Get full text
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007
ISSN:1431-9276
1435-8115
DOI:10.1017/S143192760707571X