TEM Investigation of Interfacial Reactions Between SrFeO2.5+x Thin Films and Silicon, Sapphire Substrates

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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Bibliographic Details
Published in:Microscopy and microanalysis 2004-08, Vol.10 (S02), p.572-573
Main Authors: Wang, Dashan, Du, Xiaomei, Tunney, James J., Post, Michael L., Gauvin, Raynald
Format: Article
Language:English
Subjects:
Interfaces
Microscopy and Microanalysis of Nanotechnology
Silicon
Thin films
Online Access:Get full text
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927604884940