First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

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Bibliographic Details
Published in:Microscopy and microanalysis 2008-08, Vol.14 (S2), p.1370-1371
Main Authors: Freitag, B, Knippels, G, Kujawa, S, Stam, M van der, Hubert, D, Tiemeijer, PC, Kisielowski, C, Denes, P, Minor, A, Dahmen, U
Format: Article
Language:English
Subjects:
Analytical Electron Microscopy: Advanced Techniques and Applications for Nanoscience
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927608087370