Material Analysis Using SEM/EDS Combined with a Raman Spectrometer

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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Bibliographic Details
Published in:Microscopy and microanalysis 2004-08, Vol.10 (S02), p.958-959
Main Authors: Kawauchi, Kazuteru, Ogura, Kazumichi, Nielsen, Charlie, Brooker, Alan D, Bennett, Robert
Format: Article
Language:English
Subjects:
Accessorizing the SEM
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
ISSN:1431-9276
1435-8115
DOI:10.1017/S143192760488190X