New Developments in Focal-Series Reconstruction

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

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Bibliographic Details
Published in:Microscopy and microanalysis 2007-08, Vol.13 (S02), p.1170-1171
Main Authors: Schlossmacher, P, Kuebel, C, Freitag, B, Hubert, D, Perquin, R
Format: Article
Language:English
Subjects:
Astigmatism
Boron
Electron Microscopy Research in an Aberration-free Environment: Applications
Electrons
User interface
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927607075976