Having Your Cake and Eating It Too: A Procedure for Obtaining Plan View and Cross Section TEM Images from the Same Site

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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Bibliographic Details
Published in:Microscopy and microanalysis 2004-08, Vol.10 (S02), p.1146-1147
Main Authors: Irwin, R. B., Anciso, A., Jones, P.J., Patton, C.
Format: Article
Language:English
Subjects:
Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences
Online Access:Get full text
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927604880383