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New Detection System for GEMINI
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
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Published in: | Microscopy and microanalysis 2004-08, Vol.10 (S02), p.1372-1373 |
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Main Authors: | , , , , , , |
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Language: | English |
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container_end_page | 1373 |
container_issue | S02 |
container_start_page | 1372 |
container_title | Microscopy and microanalysis |
container_volume | 10 |
creator | Steigerwald, Michael Dieter Gerhard Arnold, Rainer Bihr, Johannes Drexel, Volker Jaksch, Heiner Preikszas, Dirk Vermeulen, Jan P |
description | Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004. |
doi_str_mv | 10.1017/S1431927604884083 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_220332222</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927604884083</cupid><sourcerecordid>1404211841</sourcerecordid><originalsourceid>FETCH-LOGICAL-c295t-1902eb056f4c351553509a2960c02b539632e9656e13fba40ed3bf2da441f2c73</originalsourceid><addsrcrecordid>eNp1kEFPwzAMhSMEEmPwAzhRcS_YcZI2RzS2MWmMw-BcpWmCOtF1JJ3Q_j0dm8QB4Yst-33P0mPsGuEOAbP7JQpCzTMFIs8F5HTCBv1KpjmiPP2ZMd3fz9lFjCsAIMjUgN0s3Ffy6Dpnu7pdJ8td7FyT-DYk0_HzbDG7ZGfefER3dexD9jYZv46e0vnLdDZ6mKeWa9mlqIG7EqTywpJEKUmCNlwrsMBLSVoRd1pJ5ZB8aQS4ikrPKyMEem4zGrLbg-8mtJ9bF7ti1W7Dun9ZcA5EvK9ehAeRDW2MwfliE-rGhF2BUOxjKP7E0DN0ZExThrp6d7_O_1Pf-9pa5A</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>220332222</pqid></control><display><type>article</type><title>New Detection System for GEMINI</title><source>Cambridge Journals Online</source><creator>Steigerwald, Michael Dieter Gerhard ; Arnold, Rainer ; Bihr, Johannes ; Drexel, Volker ; Jaksch, Heiner ; Preikszas, Dirk ; Vermeulen, Jan P</creator><creatorcontrib>Steigerwald, Michael Dieter Gerhard ; Arnold, Rainer ; Bihr, Johannes ; Drexel, Volker ; Jaksch, Heiner ; Preikszas, Dirk ; Vermeulen, Jan P</creatorcontrib><description>Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.</description><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927604884083</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>Advances In Instrumentation and Technique ; Electrons ; Energy ; Sensors ; Topography</subject><ispartof>Microscopy and microanalysis, 2004-08, Vol.10 (S02), p.1372-1373</ispartof><rights>2004 Microscopy Society of America</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c295t-1902eb056f4c351553509a2960c02b539632e9656e13fba40ed3bf2da441f2c73</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S1431927604884083/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,72960</link.rule.ids></links><search><creatorcontrib>Steigerwald, Michael Dieter Gerhard</creatorcontrib><creatorcontrib>Arnold, Rainer</creatorcontrib><creatorcontrib>Bihr, Johannes</creatorcontrib><creatorcontrib>Drexel, Volker</creatorcontrib><creatorcontrib>Jaksch, Heiner</creatorcontrib><creatorcontrib>Preikszas, Dirk</creatorcontrib><creatorcontrib>Vermeulen, Jan P</creatorcontrib><title>New Detection System for GEMINI</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><description>Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.</description><subject>Advances In Instrumentation and Technique</subject><subject>Electrons</subject><subject>Energy</subject><subject>Sensors</subject><subject>Topography</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNp1kEFPwzAMhSMEEmPwAzhRcS_YcZI2RzS2MWmMw-BcpWmCOtF1JJ3Q_j0dm8QB4Yst-33P0mPsGuEOAbP7JQpCzTMFIs8F5HTCBv1KpjmiPP2ZMd3fz9lFjCsAIMjUgN0s3Ffy6Dpnu7pdJ8td7FyT-DYk0_HzbDG7ZGfefER3dexD9jYZv46e0vnLdDZ6mKeWa9mlqIG7EqTywpJEKUmCNlwrsMBLSVoRd1pJ5ZB8aQS4ikrPKyMEem4zGrLbg-8mtJ9bF7ti1W7Dun9ZcA5EvK9ehAeRDW2MwfliE-rGhF2BUOxjKP7E0DN0ZExThrp6d7_O_1Pf-9pa5A</recordid><startdate>20040801</startdate><enddate>20040801</enddate><creator>Steigerwald, Michael Dieter Gerhard</creator><creator>Arnold, Rainer</creator><creator>Bihr, Johannes</creator><creator>Drexel, Volker</creator><creator>Jaksch, Heiner</creator><creator>Preikszas, Dirk</creator><creator>Vermeulen, Jan P</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope></search><sort><creationdate>20040801</creationdate><title>New Detection System for GEMINI</title><author>Steigerwald, Michael Dieter Gerhard ; Arnold, Rainer ; Bihr, Johannes ; Drexel, Volker ; Jaksch, Heiner ; Preikszas, Dirk ; Vermeulen, Jan P</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c295t-1902eb056f4c351553509a2960c02b539632e9656e13fba40ed3bf2da441f2c73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Advances In Instrumentation and Technique</topic><topic>Electrons</topic><topic>Energy</topic><topic>Sensors</topic><topic>Topography</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Steigerwald, Michael Dieter Gerhard</creatorcontrib><creatorcontrib>Arnold, Rainer</creatorcontrib><creatorcontrib>Bihr, Johannes</creatorcontrib><creatorcontrib>Drexel, Volker</creatorcontrib><creatorcontrib>Jaksch, Heiner</creatorcontrib><creatorcontrib>Preikszas, Dirk</creatorcontrib><creatorcontrib>Vermeulen, Jan P</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>Nursing & Allied Health Database</collection><collection>Neurosciences Abstracts</collection><collection>ProQuest_Health & Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>Advanced Technologies & Aerospace Database (1962 - current)</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>AUTh Library subscriptions: ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health & Medical Complete (Alumni)</collection><collection>Nursing & Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health & Medical Collection (Alumni Edition)</collection><collection>PML(ProQuest Medical Library)</collection><collection>ProQuest Biological Science Journals</collection><collection>Nursing & Allied Health Premium</collection><collection>ProQuest advanced technologies & aerospace journals</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Steigerwald, Michael Dieter Gerhard</au><au>Arnold, Rainer</au><au>Bihr, Johannes</au><au>Drexel, Volker</au><au>Jaksch, Heiner</au><au>Preikszas, Dirk</au><au>Vermeulen, Jan P</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>New Detection System for GEMINI</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2004-08-01</date><risdate>2004</risdate><volume>10</volume><issue>S02</issue><spage>1372</spage><epage>1373</epage><pages>1372-1373</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><abstract>Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.</abstract><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S1431927604884083</doi><tpages>2</tpages></addata></record> |
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identifier | ISSN: 1431-9276 |
ispartof | Microscopy and microanalysis, 2004-08, Vol.10 (S02), p.1372-1373 |
issn | 1431-9276 1435-8115 |
language | eng |
recordid | cdi_proquest_journals_220332222 |
source | Cambridge Journals Online |
subjects | Advances In Instrumentation and Technique Electrons Energy Sensors Topography |
title | New Detection System for GEMINI |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T14%3A11%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=New%20Detection%20System%20for%20GEMINI&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Steigerwald,%20Michael%20Dieter%20Gerhard&rft.date=2004-08-01&rft.volume=10&rft.issue=S02&rft.spage=1372&rft.epage=1373&rft.pages=1372-1373&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927604884083&rft_dat=%3Cproquest_cross%3E1404211841%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c295t-1902eb056f4c351553509a2960c02b539632e9656e13fba40ed3bf2da441f2c73%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=220332222&rft_id=info:pmid/&rft_cupid=10_1017_S1431927604884083&rfr_iscdi=true |