Cs Corrector for Illumination

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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Bibliographic Details
Published in:Microscopy and microanalysis 2004-08, Vol.10 (S02), p.1004-1005
Main Authors: Sawada, Hidetaka, Tomita, Takeshi, Naruse, Mikio, Honda, Toshikazu, Hartel, Peter, Haider, Max, Hetherington, Crispin J D, Doole, Ron C, Kirkland, Angus I, Hutchison, John L, Titchmarsh, John M, Cockayne, David J H
Format: Article
Language:English
Subjects:
Aberration Correction, Electron Holography, High-Resolution TEM
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927604884897