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Sample Preparation Considerations for Electron Microscopy Characterization of Nano-Materials
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
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| Published in: | Microscopy and microanalysis 2008-08, Vol.14 (S2), p.382-383 |
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| Format: | Article |
| Language: | English |
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| container_end_page | 383 |
| container_issue | S2 |
| container_start_page | 382 |
| container_title | Microscopy and microanalysis |
| container_volume | 14 |
| creator | Walck, SD |
| description | Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008 |
| doi_str_mv | 10.1017/S1431927608087850 |
| format | article |
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| fulltext | fulltext |
| identifier | ISSN: 1431-9276 |
| ispartof | Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.382-383 |
| issn | 1431-9276 1435-8115 |
| language | eng |
| recordid | cdi_proquest_journals_220334704 |
| source | Cambridge University Press |
| subjects | Sample preparation Special Topic Session: EM Preparation Revisited - Dealing with the Nanoworld |
| title | Sample Preparation Considerations for Electron Microscopy Characterization of Nano-Materials |
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