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Two Methods of Conductive Coating for Scanning Electron Microscopy of Maize Weevils (Sitophilus zeamais) Compared by Energy Dispersive Spectroscopy
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
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Published in: | Microscopy and microanalysis 2008-08, Vol.14 (S2), p.704-705 |
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container_end_page | 705 |
container_issue | S2 |
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container_title | Microscopy and microanalysis |
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creator | Pendleton, MW Ellis, EA Pendleton, BB Holzenburg, A |
description | Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008 |
doi_str_mv | 10.1017/S1431927608082342 |
format | article |
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source | Cambridge University Press |
subjects | Microscopy and Analysis of Soft Matter: from the Molecules Up |
title | Two Methods of Conductive Coating for Scanning Electron Microscopy of Maize Weevils (Sitophilus zeamais) Compared by Energy Dispersive Spectroscopy |
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