Crystal growth and x-ray diffraction characterization of Sb2Te3 single crystal

We report the single crystal growth and X-ray diffraction characterization of bulk Sb2Te3 single crystal. Single crystal of Sb2Te3 was grown by modified Bridgman method. The diffraction peaks corresponding to {0, 0, 3} planesreveal the growth of crystal along the c-direction. X-ray diffraction analy...

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Bibliographic Details
Main Authors: Rajput, Indu, Rana, Sumesh, Jena, Rudra Prasad, Lakhani, Archana
Format: Conference Proceeding
Language:English
Subjects:
Antimony telluride
Bridgman method
Crystal growth
Crystal structure
Silicon
Single crystals
Unit cell
X-ray diffraction
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Summary:We report the single crystal growth and X-ray diffraction characterization of bulk Sb2Te3 single crystal. Single crystal of Sb2Te3 was grown by modified Bridgman method. The diffraction peaks corresponding to {0, 0, 3} planesreveal the growth of crystal along the c-direction. X-ray diffraction analysis by rietveld refinement confirms and verifies the phase purity, rhombohedral structure and single crystalline nature of the prepared Sb2Te3 crystal. Unit cell structure of Sb2Te3 consist of three quintuple layers stacked one above the other.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.5098624