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On the effect of atomic layer deposited Al2O3 on the environmental degradation of hybrid perovskite probed by positron annihilation spectroscopy
The degradation of hybrid perovskite films when exposed to ambient air is a major challenge for the development of perovskite-based photovoltaics at large scale. At present, little is known about the environmental degradation of perovskite films associated with the development of structural defects...
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| Published in: | Journal of materials chemistry. C, Materials for optical and electronic devices Materials for optical and electronic devices, 2019, Vol.7 (18), p.5275-5284 |
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| container_end_page | 5284 |
| container_issue | 18 |
| container_start_page | 5275 |
| container_title | Journal of materials chemistry. C, Materials for optical and electronic devices |
| container_volume | 7 |
| creator | Dibyashree Koushik Naziris, Frideriki Melskens, Jimmy Nusteling, Amber Zardetto, Valerio Schut, Henk Kessels, Wilhelmus M M Eijt, Stephan W H Creatore, Mariadriana |
| description | The degradation of hybrid perovskite films when exposed to ambient air is a major challenge for the development of perovskite-based photovoltaics at large scale. At present, little is known about the environmental degradation of perovskite films associated with the development of structural defects or open volumes (such as atomic vacancies, voids, crystallographic defects and grain boundary defects) in the lattice, and about the depth dependence of the structural degradation. Therefore, in this work, we use Doppler broadening-positron annihilation spectroscopy (DB-PAS) depth-profiling to gain insight into the structural degradation of CH3NH3PbI3−xClx perovskite when exposed to ambient air. In parallel, we investigate the effect of ultrathin ( |
| doi_str_mv | 10.1039/c8tc06330c |
| format | article |
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At present, little is known about the environmental degradation of perovskite films associated with the development of structural defects or open volumes (such as atomic vacancies, voids, crystallographic defects and grain boundary defects) in the lattice, and about the depth dependence of the structural degradation. Therefore, in this work, we use Doppler broadening-positron annihilation spectroscopy (DB-PAS) depth-profiling to gain insight into the structural degradation of CH3NH3PbI3−xClx perovskite when exposed to ambient air. In parallel, we investigate the effect of ultrathin (<1 nm) atomic layer deposited (ALD) Al2O3 processed directly on top of the perovskite as a means to suppress the degradation process. Specifically, we infer that the perovskite degradation involves changes in open volumes in its crystal lattice. This could be caused by the ingress of H2O molecules into the cation vacancies. In parallel, chemical changes in the perovskite films upon decomposition are observed, accompanied by a decrease in the film thickness as a function of air exposure time. When the perovskite films are decorated with ALD Al2O3, the latter delays the thickness reduction of the perovskite layer during air exposure and also suppresses the changes in its open volumes and chemical transformations. Our findings illustrate that an improved understanding of the perovskite degradation process can be obtained using DB-PAS, especially when combined with other thin film characterization techniques, such as X-ray diffraction and X-ray photoelectron spectroscopy.</description><identifier>ISSN: 2050-7526</identifier><identifier>EISSN: 2050-7534</identifier><identifier>DOI: 10.1039/c8tc06330c</identifier><language>eng</language><publisher>Cambridge: Royal Society of Chemistry</publisher><subject>Aluminum oxide ; Atomic layer epitaxy ; Crystal defects ; Crystal lattices ; Crystallography ; Defects ; Degradation ; Dependence ; Depth profiling ; Exposure ; Film thickness ; Grain boundaries ; Lattice vacancies ; Organic chemistry ; Perovskites ; Photoelectrons ; Photovoltaic cells ; Positron annihilation ; Solar cells ; Spectrum analysis ; Thin films ; Titanium dioxide ; Water chemistry ; X ray photoelectron spectroscopy ; X-ray diffraction</subject><ispartof>Journal of materials chemistry. C, Materials for optical and electronic devices, 2019, Vol.7 (18), p.5275-5284</ispartof><rights>Copyright Royal Society of Chemistry 2019</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,4024,27923,27924,27925</link.rule.ids></links><search><creatorcontrib>Dibyashree Koushik</creatorcontrib><creatorcontrib>Naziris, Frideriki</creatorcontrib><creatorcontrib>Melskens, Jimmy</creatorcontrib><creatorcontrib>Nusteling, Amber</creatorcontrib><creatorcontrib>Zardetto, Valerio</creatorcontrib><creatorcontrib>Schut, Henk</creatorcontrib><creatorcontrib>Kessels, Wilhelmus M M</creatorcontrib><creatorcontrib>Eijt, Stephan W H</creatorcontrib><creatorcontrib>Creatore, Mariadriana</creatorcontrib><title>On the effect of atomic layer deposited Al2O3 on the environmental degradation of hybrid perovskite probed by positron annihilation spectroscopy</title><title>Journal of materials chemistry. C, Materials for optical and electronic devices</title><description>The degradation of hybrid perovskite films when exposed to ambient air is a major challenge for the development of perovskite-based photovoltaics at large scale. At present, little is known about the environmental degradation of perovskite films associated with the development of structural defects or open volumes (such as atomic vacancies, voids, crystallographic defects and grain boundary defects) in the lattice, and about the depth dependence of the structural degradation. Therefore, in this work, we use Doppler broadening-positron annihilation spectroscopy (DB-PAS) depth-profiling to gain insight into the structural degradation of CH3NH3PbI3−xClx perovskite when exposed to ambient air. In parallel, we investigate the effect of ultrathin (<1 nm) atomic layer deposited (ALD) Al2O3 processed directly on top of the perovskite as a means to suppress the degradation process. Specifically, we infer that the perovskite degradation involves changes in open volumes in its crystal lattice. This could be caused by the ingress of H2O molecules into the cation vacancies. In parallel, chemical changes in the perovskite films upon decomposition are observed, accompanied by a decrease in the film thickness as a function of air exposure time. When the perovskite films are decorated with ALD Al2O3, the latter delays the thickness reduction of the perovskite layer during air exposure and also suppresses the changes in its open volumes and chemical transformations. Our findings illustrate that an improved understanding of the perovskite degradation process can be obtained using DB-PAS, especially when combined with other thin film characterization techniques, such as X-ray diffraction and X-ray photoelectron spectroscopy.</description><subject>Aluminum oxide</subject><subject>Atomic layer epitaxy</subject><subject>Crystal defects</subject><subject>Crystal lattices</subject><subject>Crystallography</subject><subject>Defects</subject><subject>Degradation</subject><subject>Dependence</subject><subject>Depth profiling</subject><subject>Exposure</subject><subject>Film thickness</subject><subject>Grain boundaries</subject><subject>Lattice vacancies</subject><subject>Organic chemistry</subject><subject>Perovskites</subject><subject>Photoelectrons</subject><subject>Photovoltaic cells</subject><subject>Positron annihilation</subject><subject>Solar cells</subject><subject>Spectrum analysis</subject><subject>Thin films</subject><subject>Titanium dioxide</subject><subject>Water chemistry</subject><subject>X ray photoelectron spectroscopy</subject><subject>X-ray diffraction</subject><issn>2050-7526</issn><issn>2050-7534</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNo9kE1qwzAQhUVpoSHNpicQdO12LFmSvQyhfxDwpl0H2ZISpY7kSkrAt-iRK5rQ2czAvPe9YRC6L-GxBNo89XXqgVMK_RWaEWBQCEar6_-Z8Fu0iHEPueqS17yZoZ_W4bTTWBuj-4S9wTL5g-3xICcdsNKjjzZphZcDaSn2F7U72eDdQbskhyzaBqlksnmbAbupC1bhUQd_il_ZjMfgu4zoJvxHy04snbM7O5xNcczZwcfej9MdujFyiHpx6XP0-fL8sXor1u3r-2q5LraE8VTQSgitaiBEEVJponvWgWg6RVkFUhoJUHZCcF4znp9jgBlRg2k4kZRQIegcPZy5-bjvo45ps_fH4HLkhuSqWDY39Bc_4Wh6</recordid><startdate>2019</startdate><enddate>2019</enddate><creator>Dibyashree Koushik</creator><creator>Naziris, Frideriki</creator><creator>Melskens, Jimmy</creator><creator>Nusteling, Amber</creator><creator>Zardetto, Valerio</creator><creator>Schut, Henk</creator><creator>Kessels, Wilhelmus M M</creator><creator>Eijt, Stephan W H</creator><creator>Creatore, Mariadriana</creator><general>Royal Society of Chemistry</general><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>2019</creationdate><title>On the effect of atomic layer deposited Al2O3 on the environmental degradation of hybrid perovskite probed by positron annihilation spectroscopy</title><author>Dibyashree Koushik ; Naziris, Frideriki ; Melskens, Jimmy ; Nusteling, Amber ; Zardetto, Valerio ; Schut, Henk ; Kessels, Wilhelmus M M ; Eijt, Stephan W H ; Creatore, Mariadriana</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-g256t-3477ed8022d224e2ec5b079bd3540aafa001b7766856103f05f780f962a323773</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Aluminum oxide</topic><topic>Atomic layer epitaxy</topic><topic>Crystal defects</topic><topic>Crystal lattices</topic><topic>Crystallography</topic><topic>Defects</topic><topic>Degradation</topic><topic>Dependence</topic><topic>Depth profiling</topic><topic>Exposure</topic><topic>Film thickness</topic><topic>Grain boundaries</topic><topic>Lattice vacancies</topic><topic>Organic chemistry</topic><topic>Perovskites</topic><topic>Photoelectrons</topic><topic>Photovoltaic cells</topic><topic>Positron annihilation</topic><topic>Solar cells</topic><topic>Spectrum analysis</topic><topic>Thin films</topic><topic>Titanium dioxide</topic><topic>Water chemistry</topic><topic>X ray photoelectron spectroscopy</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Dibyashree Koushik</creatorcontrib><creatorcontrib>Naziris, Frideriki</creatorcontrib><creatorcontrib>Melskens, Jimmy</creatorcontrib><creatorcontrib>Nusteling, Amber</creatorcontrib><creatorcontrib>Zardetto, Valerio</creatorcontrib><creatorcontrib>Schut, Henk</creatorcontrib><creatorcontrib>Kessels, Wilhelmus M M</creatorcontrib><creatorcontrib>Eijt, Stephan W H</creatorcontrib><creatorcontrib>Creatore, Mariadriana</creatorcontrib><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of materials chemistry. 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In parallel, we investigate the effect of ultrathin (<1 nm) atomic layer deposited (ALD) Al2O3 processed directly on top of the perovskite as a means to suppress the degradation process. Specifically, we infer that the perovskite degradation involves changes in open volumes in its crystal lattice. This could be caused by the ingress of H2O molecules into the cation vacancies. In parallel, chemical changes in the perovskite films upon decomposition are observed, accompanied by a decrease in the film thickness as a function of air exposure time. When the perovskite films are decorated with ALD Al2O3, the latter delays the thickness reduction of the perovskite layer during air exposure and also suppresses the changes in its open volumes and chemical transformations. 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| subjects | Aluminum oxide Atomic layer epitaxy Crystal defects Crystal lattices Crystallography Defects Degradation Dependence Depth profiling Exposure Film thickness Grain boundaries Lattice vacancies Organic chemistry Perovskites Photoelectrons Photovoltaic cells Positron annihilation Solar cells Spectrum analysis Thin films Titanium dioxide Water chemistry X ray photoelectron spectroscopy X-ray diffraction |
| title | On the effect of atomic layer deposited Al2O3 on the environmental degradation of hybrid perovskite probed by positron annihilation spectroscopy |
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