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Structural, Morphological, and Optical Properties of Nanocrystalline (Bi2O3)1−x:(TiO2)x Thin Films for Transparent Electronics

The fabrication of low cost and eco-friendly transparent electronics using metal oxide semiconductors is still a challenging task. In this work, transparent nanocrystalline (Bi 2 O 3 ) 1− x :(TiO 2 ) x thin films were synthesized using a pulsed laser deposition technique (PLD); XRD analysis shows th...

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Bibliographic Details
Published in:Plasmonics (Norwell, Mass.) Mass.), 2019-06, Vol.14 (3), p.623-630
Main Authors: Gbashi, Kadhim R., Najim, Aus A., Muhi, Malek A. H., Salih, Ammar T.
Format: Article
Language:English
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Summary:The fabrication of low cost and eco-friendly transparent electronics using metal oxide semiconductors is still a challenging task. In this work, transparent nanocrystalline (Bi 2 O 3 ) 1− x :(TiO 2 ) x thin films were synthesized using a pulsed laser deposition technique (PLD); XRD analysis shows the films have polycrystalline structure of monoclinic Bi 2 O 3 ; morphological and topographical properties were analyzed by SEM and AFM showing the films have smooth surfaces with RMS roughness (4.26–7.37 nm) with micro-and nano-spheres (2 μm to 23 nm); the optical properties were analyzed by Uv-Vis spectrometer and revealed high transmittance in the visible range; the best results were obtained at x  = 0.05 where the highest crystallinity, highest transmittance (> 82%), and highest band gap (3.769 eV) were achieved; and empirical models have been proposed to estimate the band gap and Bi–O bond lengths as a function of TiO 2 concentration with excellent coincidence with the experimental data.
ISSN:1557-1955
1557-1963
DOI:10.1007/s11468-018-0840-1