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P‐80: An Evaluation of De‐Sense through Analyzing Display Module RF Noise
An evaluation method for de‐sense due to display module is proposed in this paper. Though de‐sense issue has been problem for decades, it is known to be difficult to infer problems from the component‐level analysis. The novel modeling is introduced and validated for estimating de‐sense in module and...
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Published in: | SID International Symposium Digest of technical papers 2019-06, Vol.50 (1), p.1537-1539 |
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container_title | SID International Symposium Digest of technical papers |
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creator | Kim, Sang Kook Yun, Yeo Jin Kim, Hyeo Jung Lee, Jung Doo Choi, Yeong Mook Shin, Won Ju Choe, Won Jun |
description | An evaluation method for de‐sense due to display module is proposed in this paper. Though de‐sense issue has been problem for decades, it is known to be difficult to infer problems from the component‐level analysis. The novel modeling is introduced and validated for estimating de‐sense in module and set measurements. |
doi_str_mv | 10.1002/sdtp.13236 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2231405786</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2231405786</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1056-9fee81fa0c0fa685468fb4bb5b0c75eae05965ddcd67b9805fa684c361a9bbd93</originalsourceid><addsrcrecordid>eNp90E1OwzAQBWALgUQpbDiBJXZIKeMkdmJ2VX8AqYWKFomd5SR2myrEIU5AYcUROCMnISGsWc1ivjcaPYTOCYwIgHtlk6oYEc_12AEauISFDhDKD9EAgAcOZ-z5GJ1YuwfwPN_nA7RcfX9-hXCNxzmevcmsllVqcmw0nqp2s1a5Vbjalabe7lojs-Yjzbd4mtoikw1emqTOFH6c43uTWnWKjrTMrDr7m0P0NJ9tJrfO4uHmbjJeODEByhyulQqJlhCDliykPgt15EcRjSAOqJIKKGc0SeKEBREPgXbKjz1GJI-ihHtDdNHfLUrzWitbib2py_Y7K1zXIz7QIGStuuxVXBprS6VFUaYvsmwEAdHVJbq6xG9dLSY9fk8z1fwjxXq6WfWZH7fSbhc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2231405786</pqid></control><display><type>article</type><title>P‐80: An Evaluation of De‐Sense through Analyzing Display Module RF Noise</title><source>Wiley-Blackwell Read & Publish Collection</source><creator>Kim, Sang Kook ; Yun, Yeo Jin ; Kim, Hyeo Jung ; Lee, Jung Doo ; Choi, Yeong Mook ; Shin, Won Ju ; Choe, Won Jun</creator><creatorcontrib>Kim, Sang Kook ; Yun, Yeo Jin ; Kim, Hyeo Jung ; Lee, Jung Doo ; Choi, Yeong Mook ; Shin, Won Ju ; Choe, Won Jun</creatorcontrib><description>An evaluation method for de‐sense due to display module is proposed in this paper. Though de‐sense issue has been problem for decades, it is known to be difficult to infer problems from the component‐level analysis. The novel modeling is introduced and validated for estimating de‐sense in module and set measurements.</description><identifier>ISSN: 0097-966X</identifier><identifier>EISSN: 2168-0159</identifier><identifier>DOI: 10.1002/sdtp.13236</identifier><language>eng</language><publisher>Campbell: Wiley Subscription Services, Inc</publisher><subject>De-sense ; Display module ; Modules</subject><ispartof>SID International Symposium Digest of technical papers, 2019-06, Vol.50 (1), p.1537-1539</ispartof><rights>2019 The Society for Information Display</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c1056-9fee81fa0c0fa685468fb4bb5b0c75eae05965ddcd67b9805fa684c361a9bbd93</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Kim, Sang Kook</creatorcontrib><creatorcontrib>Yun, Yeo Jin</creatorcontrib><creatorcontrib>Kim, Hyeo Jung</creatorcontrib><creatorcontrib>Lee, Jung Doo</creatorcontrib><creatorcontrib>Choi, Yeong Mook</creatorcontrib><creatorcontrib>Shin, Won Ju</creatorcontrib><creatorcontrib>Choe, Won Jun</creatorcontrib><title>P‐80: An Evaluation of De‐Sense through Analyzing Display Module RF Noise</title><title>SID International Symposium Digest of technical papers</title><description>An evaluation method for de‐sense due to display module is proposed in this paper. Though de‐sense issue has been problem for decades, it is known to be difficult to infer problems from the component‐level analysis. The novel modeling is introduced and validated for estimating de‐sense in module and set measurements.</description><subject>De-sense</subject><subject>Display module</subject><subject>Modules</subject><issn>0097-966X</issn><issn>2168-0159</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp90E1OwzAQBWALgUQpbDiBJXZIKeMkdmJ2VX8AqYWKFomd5SR2myrEIU5AYcUROCMnISGsWc1ivjcaPYTOCYwIgHtlk6oYEc_12AEauISFDhDKD9EAgAcOZ-z5GJ1YuwfwPN_nA7RcfX9-hXCNxzmevcmsllVqcmw0nqp2s1a5Vbjalabe7lojs-Yjzbd4mtoikw1emqTOFH6c43uTWnWKjrTMrDr7m0P0NJ9tJrfO4uHmbjJeODEByhyulQqJlhCDliykPgt15EcRjSAOqJIKKGc0SeKEBREPgXbKjz1GJI-ihHtDdNHfLUrzWitbib2py_Y7K1zXIz7QIGStuuxVXBprS6VFUaYvsmwEAdHVJbq6xG9dLSY9fk8z1fwjxXq6WfWZH7fSbhc</recordid><startdate>201906</startdate><enddate>201906</enddate><creator>Kim, Sang Kook</creator><creator>Yun, Yeo Jin</creator><creator>Kim, Hyeo Jung</creator><creator>Lee, Jung Doo</creator><creator>Choi, Yeong Mook</creator><creator>Shin, Won Ju</creator><creator>Choe, Won Jun</creator><general>Wiley Subscription Services, Inc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>201906</creationdate><title>P‐80: An Evaluation of De‐Sense through Analyzing Display Module RF Noise</title><author>Kim, Sang Kook ; Yun, Yeo Jin ; Kim, Hyeo Jung ; Lee, Jung Doo ; Choi, Yeong Mook ; Shin, Won Ju ; Choe, Won Jun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1056-9fee81fa0c0fa685468fb4bb5b0c75eae05965ddcd67b9805fa684c361a9bbd93</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>De-sense</topic><topic>Display module</topic><topic>Modules</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kim, Sang Kook</creatorcontrib><creatorcontrib>Yun, Yeo Jin</creatorcontrib><creatorcontrib>Kim, Hyeo Jung</creatorcontrib><creatorcontrib>Lee, Jung Doo</creatorcontrib><creatorcontrib>Choi, Yeong Mook</creatorcontrib><creatorcontrib>Shin, Won Ju</creatorcontrib><creatorcontrib>Choe, Won Jun</creatorcontrib><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>SID International Symposium Digest of technical papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kim, Sang Kook</au><au>Yun, Yeo Jin</au><au>Kim, Hyeo Jung</au><au>Lee, Jung Doo</au><au>Choi, Yeong Mook</au><au>Shin, Won Ju</au><au>Choe, Won Jun</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>P‐80: An Evaluation of De‐Sense through Analyzing Display Module RF Noise</atitle><jtitle>SID International Symposium Digest of technical papers</jtitle><date>2019-06</date><risdate>2019</risdate><volume>50</volume><issue>1</issue><spage>1537</spage><epage>1539</epage><pages>1537-1539</pages><issn>0097-966X</issn><eissn>2168-0159</eissn><abstract>An evaluation method for de‐sense due to display module is proposed in this paper. Though de‐sense issue has been problem for decades, it is known to be difficult to infer problems from the component‐level analysis. The novel modeling is introduced and validated for estimating de‐sense in module and set measurements.</abstract><cop>Campbell</cop><pub>Wiley Subscription Services, Inc</pub><doi>10.1002/sdtp.13236</doi><tpages>3</tpages></addata></record> |
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subjects | De-sense Display module Modules |
title | P‐80: An Evaluation of De‐Sense through Analyzing Display Module RF Noise |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T11%3A04%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=P%E2%80%9080:%20An%20Evaluation%20of%20De%E2%80%90Sense%20through%20Analyzing%20Display%20Module%20RF%20Noise&rft.jtitle=SID%20International%20Symposium%20Digest%20of%20technical%20papers&rft.au=Kim,%20Sang%20Kook&rft.date=2019-06&rft.volume=50&rft.issue=1&rft.spage=1537&rft.epage=1539&rft.pages=1537-1539&rft.issn=0097-966X&rft.eissn=2168-0159&rft_id=info:doi/10.1002/sdtp.13236&rft_dat=%3Cproquest_cross%3E2231405786%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c1056-9fee81fa0c0fa685468fb4bb5b0c75eae05965ddcd67b9805fa684c361a9bbd93%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2231405786&rft_id=info:pmid/&rfr_iscdi=true |