Bipolar Log-Intensity-Variance Histogram Method for Local Image Patch Intensity Change Measurements

For a fixed-position camera, the intensity changes of an image pixel are often caused by object movement or illumination change. This paper focuses on such a problem: given two adjacent local image patches, how can the causes of intensity change be determined? A bipolar log-intensity-variance histog...

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Bibliographic Details
Published in:Mathematical problems in engineering 2019-01, Vol.2019 (2019), p.1-16
Main Authors: Wei, Ming, Xu, Zhihuo, Shi, Quan, Wang, Han, Ko, Hanseok
Format: Article
Language:English
Subjects:
Classification
Consumer electronics
False alarms
Histograms
International conferences
Mathematical problems
Methods
Pattern recognition
Position measurement
Signal processing
Variance
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Description
Summary:For a fixed-position camera, the intensity changes of an image pixel are often caused by object movement or illumination change. This paper focuses on such a problem: given two adjacent local image patches, how can the causes of intensity change be determined? A bipolar log-intensity-variance histogram is proposed to describe the intensity variations on the chaos phase plot subspace. This is combined with two sigmoid functions to construct a probabilistic measure function. Experimental results show that the proposed measurements are more effective and robust than conventional methods to the cause of variation in image intensity.
ISSN:1024-123X
1563-5147
DOI:10.1155/2019/3651529