X-ray fluorescence determination of Ni, Ti and Nb in memory alloys using solution and thin film samples with an internal standard

NiTiNb memory alloys are important functional materials in industrial applications. The content of Ni, Ti and Nb must be accurately known in order to control its quality. However, at present, there is not a fast and accurate method that can be used for the accurate analysis of the high content of Ni...

Full description

Saved in:
Bibliographic Details
Published in:Analytical methods 2019-07, Vol.11 (28), p.3619-3622
Main Authors: Tian, L. F, Dai, Y. C, Zou, D. S, Lei, T. C, Huang, S. K
Format: Article
Language:English
Subjects:
Alloys
Chemical analysis
Emission analysis
Filter paper
Fluorescence
Functional materials
Hydrofluoric acid
Inductively coupled plasma
Industrial applications
Nickel
Niobium
Nitric acid
Optical emission spectroscopy
Organic chemistry
Specimen preparation
Spectrometry
Ternary alloys
Thin films
X-ray fluorescence
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:NiTiNb memory alloys are important functional materials in industrial applications. The content of Ni, Ti and Nb must be accurately known in order to control its quality. However, at present, there is not a fast and accurate method that can be used for the accurate analysis of the high content of Ni, Ti and Nb. To solve this problem, an X-ray fluorescence (XRF) method is proposed for determining the amounts of Ni, Ti and Nb in these ternary alloys. The alloy sample was dissolved in a mixture of nitric acid and hydrofluoric acid, and Co was added as an internal standard to improve precision. A portion of solution was transferred into a liquid cell for XRF analysis, and another portion was loaded and dried in a filter paper disk as a thin film specimen for XRF analysis. The features of the two specimen preparation methods were compared and it was found that the solution method was more suitable for the XRF analysis of Ni, Ti and Nb. The proposed XRF method is fast and accurate, and can determine Ni, Ti and Nb simultaneously. The results are in excellent agreement with those given by wet chemical analysis methods and inductively coupled plasma-optical emission spectrometry (ICP-OES). Specimen for XRF analysis of high content of Ni, Ti and Nb in memory alloys, prepared by solution (a) and a filter paper disk (b).
ISSN:1759-9660
1759-9679
DOI:10.1039/c9ay00959k