Electrical modulation of magnetism in multiferroic heterostructures at room temperature

Multiferroic heterostructures CoPd/0.68Pb(Mg 1/3 Nb 2/3 )O 3 –0.32PbTiO 3 (001) (CoPd/PMN–PT) with the thickness of 10 nm were fabricated via magnetron sputtering. The effect of electric field on remanent magnetization, coercivity, and magnetization reversal have been subsequently investigated. A la...

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Bibliographic Details
Published in:Journal of materials science 2017-03, Vol.52 (6), p.3330-3336
Main Authors: Yang, Y. T., Li, J., Peng, X. L., Hong, B., Wang, X. Q., Ge, H. L.
Format: Article
Language:English
Subjects:
Characterization and Evaluation of Materials
Chemistry and Materials Science
Classical Mechanics
Coercivity
Crystallography and Scattering Methods
Electric fields
Heterostructures
Intermetallic compounds
Magnetic devices
Magnetic properties
Magnetism
Magnetization
Magnetization reversal
Magnetron sputtering
Materials Science
Modulation
Multiferroic materials
Original Paper
Polymer Sciences
Room temperature
Solid Mechanics
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Summary:Multiferroic heterostructures CoPd/0.68Pb(Mg 1/3 Nb 2/3 )O 3 –0.32PbTiO 3 (001) (CoPd/PMN–PT) with the thickness of 10 nm were fabricated via magnetron sputtering. The effect of electric field on remanent magnetization, coercivity, and magnetization reversal have been subsequently investigated. A large electric field modulation of magnetism is obtained in strain-mediated CoPd/PMN–PT multiferroic heterostructures. Not only the remanent magnetization but also the magnetic coercivity of CoPd film can be effectively modulated by an electric field. Up to 30.7% of magnetization difference is observed by electric field at the vicinity of the magnetic coercivity. Taking the advantage of the different coercivity controlled by electric field, the magnetization reversal can be assisted by electric field. The magnetization reversal process of the CoPd/PMN–PT heterostructure is dominated by the Kondorsky model. Our results provide great opportunities for electric field-controlled magnetic devices.
ISSN:0022-2461
1573-4803
DOI:10.1007/s10853-016-0620-2