Emission Spectroscope Diagnostics of Direct Current Plasma Jets Used for YSZ Equiaxed Structure Coatings

• Published in: Key engineering materials 2019-08, Vol.815, p.61-69
• Main Authors: Sun, Cheng Qi, Gao, Yan, An, Lian Tong
• Format: Article
• Language: English
• Subjects: Coatings; Direct current; Electron energy; Emission analysis; Equiaxed structure; Field emission microscopy; Flow velocity; Nanoparticles; Partial stabilization; Partially stabilized zirconia; Plasma; Plasma jets; Sprayed coatings; Temperature; Thermal plasmas; Yttria-stabilized zirconia; Yttrium oxide; Zirconium dioxide
• ISSN: 1013-9826; 1662-9795; 1662-9795
• DOI: 10.4028/www.scientific.net/KEM.815.61

This study combines spectroscope diagnostics of the plasma jet under APS and the characterization of sprayed coatings by using nanoparticles yttria partially stabilized zirconia (YSZ) powder. The absolute intensities of ArⅠneutral species spectrum lines were used to estimate the electron excited temperature of the thermal plasma jets by the Boltzmann method. The effects of the detection distances, current intensities and H2 flow rates on electron temperature were analyzed. The plasma sprayed YSZ coatings were heated to 1200°C for 6 min under the atmosphere, and then the micro-structure of the nanostructured powder and coatings were analyzed by using Field Emission Scanning Electron Microscope. The results showed that the increase of input power and H2 content considerably increased the electron temperature, while the electron temperature decreased a lot with the increase of the detection distance. The coatings were consisted of the equiaxed grains and a small-size grain shape pores.