Resonance Raman Scattering Spectroscopy of Four-Monolayer Thick MoS2 Films

We studied the Raman scattering in bulk and four-monolayer thick MoS 2 films under the resonance laser excitation of A, B, and C excitons. We demonstrate the fine structure agility of a phonon mode associated with out-of-plane vibration of sulfur atoms (A 1 g ) when passing from bulk to atomically t...

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Bibliographic Details
Published in:Journal of Russian laser research 2019-05, Vol.40 (3), p.269-273
Main Authors: Bagaev, V. S., Krivobok, V. S., Nikolaev, S. N., Chernopitssky, M. A., Savin, K. A.
Format: Article
Language:English
Subjects:
Excitation
Excitons
Fine structure
Lasers
Microwaves
Molybdenum disulfide
Monolayers
Optical Devices
Optics
Phonons
Photonics
Physics
Physics and Astronomy
Raman spectra
Resonance scattering
RF and Optical Engineering
Thick films
Thin films
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Summary:We studied the Raman scattering in bulk and four-monolayer thick MoS 2 films under the resonance laser excitation of A, B, and C excitons. We demonstrate the fine structure agility of a phonon mode associated with out-of-plane vibration of sulfur atoms (A 1 g ) when passing from bulk to atomically thin film. The C exciton resonance excitation allows us to register the line corresponding to optical-phonon (E 1 g ) scattering and the set of peaks with a 660 – 740 cm − 1 Stokes shift associated with resonance scattering by two optical (E u ) phonons.
ISSN:1071-2836
1573-8760
DOI:10.1007/s10946-019-09801-8