Film thickness and roughness of ZDDP antiwear films

The two experimental techniques, spacer layer interferometry imaging (SLIM) and atomic force microscopy (AFM), have been used to measure the thickness and roughness of zinc dialkyl dithiophosphate (ZDDP) reaction films formed in a rolling-sliding minitraction machine (MTM) tribometer. The AFM method...

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Bibliographic Details
Published in:Tribology letters 2007-05, Vol.26 (2), p.161-171
Main Authors: Topolovec-Miklozic, Ksenija, Forbus, T. Reg, Spikes, Hugh A.
Format: Article
Language:English
Subjects:
Atomic force microscopy
Ethylenediaminetetraacetic acids
Film thickness
Morphology
Roughness
Rubbing
Thickness measurement
Tribology
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Summary:The two experimental techniques, spacer layer interferometry imaging (SLIM) and atomic force microscopy (AFM), have been used to measure the thickness and roughness of zinc dialkyl dithiophosphate (ZDDP) reaction films formed in a rolling-sliding minitraction machine (MTM) tribometer. The AFM method has been complemented by a novel ZDDP film removal method based on ethylenediaminetetraacetic acid (EDTA) solution. It has been found that the two approaches measure very similar ZDDP film thickness values, lending credence to both methods. However the AFM approach measures much rougher ZDDP reaction films than MTM-SLIM and it is believed that SLIM underestimates the film roughness. Based on this, the use of MTM-SLIM is recommended for monitoring the evolution of antiwear film thickness during rubbing, while AFM should be employed for studying the morphology of antiwear films.
ISSN:1023-8883
1573-2711
DOI:10.1007/s11249-006-9189-2