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Measurement of the relative response of TowerJazz Mini-MALTA CMOS prototypes at Diamond Light Source

This paper outlines the results of investigations into the effects of radiation damage in the mini-MALTA prototype. Measurements were carried out at Diamond Light Source using a micro-focus X-ray beam, which scanned across the surface of the device in 2 \(\mathrm{\mu m}\) steps. This allowed the in-...

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Bibliographic Details
Published in:arXiv.org 2019-10
Main Authors: Mironova, Maria, Metodiev, Kaloyan, Allport, Phil, Berdalovic, Ivan, Bortoletto, Daniela, Buttar, Craig, Cardella, Roberto, Dao, Valerio, Dyndal, Mateusz, Freeman, Patrick, Leyre Flores Sanz de Acedo, Gonella, Laura, Kugathasan, Thanushan, Pernegger, Heinz, Piro, Francesco, Plackett, Richard, Riedler, Petra, Sharma, Abhishek, Enrico Junior Schioppa, Shipsey, Ian, Carlos Solans Sanchez, Snoeys, Walter, Wennloef, Hakan, Weatherill, Daniel, Wood, Daniel, Worm, Steven
Format: Article
Language:English
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Summary:This paper outlines the results of investigations into the effects of radiation damage in the mini-MALTA prototype. Measurements were carried out at Diamond Light Source using a micro-focus X-ray beam, which scanned across the surface of the device in 2 \(\mathrm{\mu m}\) steps. This allowed the in-pixel photon response to be measured directly with high statistics. Three pixel design variations were considered: one with the standard continuous \(\mathrm{n^-}\) layer layout and front-end, and extra deep p-well and \(\mathrm{n^-}\) gap designs with a modified front-end. Five chips were measured: one unirradiated, one neutron irradiated, and three proton irradiated.
ISSN:2331-8422
DOI:10.48550/arxiv.1909.08392