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SEM morphological analysis of irradiated polystyrene film doped by a Schiff base containing a 1,2,4-triazole ring system

A Schiff base containing the 1,2,4-triazole moiety was synthesized and added to polystyrene at low concentration for a homogenous blend. The polystyrene film was irradiated with ultraviolet light and the surface morphology was analyzed. Micrographs of the polystyrene/Schiff base blend after irradiat...

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Published in:Applied petrochemical research 2019-12, Vol.9 (3-4), p.169-177
Main Authors: Ahmed, Ahmed A., Ahmed, Dina S., El-Hiti, Gamal A., Alotaibi, Mohammad Hayal, Hashim, Hassan, Yousif, Emad
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description A Schiff base containing the 1,2,4-triazole moiety was synthesized and added to polystyrene at low concentration for a homogenous blend. The polystyrene film was irradiated with ultraviolet light and the surface morphology was analyzed. Micrographs of the polystyrene/Schiff base blend after irradiation indicated the fabrication of a terrestrial crack-like material. This was ascribed to the presence of the Schiff base, relatively long irradiation time, and photostability induced by the base. After irradiation, the blank polystyrene film formed a cotton-like fibrous material.
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subjects Catalysis
Chemistry
Chemistry and Materials Science
Cotton
Energy Systems
Fabrication
Imines
Industrial Chemistry/Chemical Engineering
Instruments (Equipment)
Irradiation
Morphology
Nanochemistry
Nanotechnology and Microengineering
Original Article
Petrochemicals industry
Photomicrographs
Polystyrene
Polystyrene resins
Protons
Schiff bases
Technology
Terrestrial environments
Triazoles
Ultraviolet radiation
title SEM morphological analysis of irradiated polystyrene film doped by a Schiff base containing a 1,2,4-triazole ring system
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