Effect of ytterbium oxide deposition on microstructural and electrical properties of thin tantalum foil

•Ytterbium oxide (174Yb2O3) is deposited on mechanically rolled tantalum (MRTa) backed thin foil.•Modification in materials and electrical properties are recorded for 174Yb2O3/MRTa backed thin film.•Yb2O3 nanostructures are formed uniformly on the MRTa surface.•Chemical inertness of the newly formed...

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Bibliographic Details
Published in:Materials letters 2019-10, Vol.253, p.67-70
Main Authors: Puri, Nidhi, Rohilla, Aman, Chamoli, S.K., Mahapatro, Ajit K.
Format: Article
Language:English
Subjects:
174Yb2O3
Crystallography
Current voltage characteristics
Deposition
Electric contacts
Electrical properties
Electrical resistivity
Electron beams
Foils
Materials science
Mechanically rolled thin foil
Nanoparticle
Nanoparticles
Ohmic conduction
Organic chemistry
Oxidation
Silver
Tantalum
Thin films
Ultrasonic testing
X ray imagery
Ytterbium
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Summary:•Ytterbium oxide (174Yb2O3) is deposited on mechanically rolled tantalum (MRTa) backed thin foil.•Modification in materials and electrical properties are recorded for 174Yb2O3/MRTa backed thin film.•Yb2O3 nanostructures are formed uniformly on the MRTa surface.•Chemical inertness of the newly formed Yb2O3/MRTa towards oxidation, is demonstrated.•Enhancement of 92.1% in electrical conductivity is observed after Yb2O3 deposition on MRTa foil. The effect of ytterbium oxide (174Yb2O3) deposition in modifying the materials and electrical properties of mechanically rolled tantalum (MRTa) thin foil is investigated through electron microscopic, crystallographic, elemental analysis, and current-voltage (I–V) characteristics. A 0.82 μm thick layer of 174Yb2O3 over ∼2.1 μm thick MRTa foil (Yb2O3/Ta) reduces the dimension of surface features, and indicates formation of nanoparticles. The electron beam imaging, energy dispersive X-ray (EDX), and X-ray diffraction (XRD) analysis reveal formation of uniformly distributed Yb2O3 on MRTa surface and chemical inertness of the newly formed Yb2O3/MRTa thin film towards oxidation. The room temperature I–V characteristics of both the MRTa foil and Yb2O3/MRTa thin film tested with silver (Ag) top contact electrodes exhibit ohmic conductions and demonstrate an overall enhancement of 92.1% in electrical conductivity after Yb2O3 thin film deposition on MRTa foil.
ISSN:0167-577X
1873-4979
DOI:10.1016/j.matlet.2019.06.016