Fabrication of an antiferroelectric NaNbO3-CaZrO3 film on a (001)SrTiO3 substrate by pulsed laser deposition

The present study demonstrates the antiferroelectric property of a 0.94NaNbO3-0.06CaZrO3 thin-film deposited on a SrRuO3 coated (001)SrTiO3 single crystal substrate fabricated by a pulsed laser deposition method. X-ray diffraction reciprocal space mapping and electron diffraction patterns show that...

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Bibliographic Details
Published in:Japanese Journal of Applied Physics 2019-11, Vol.58 (SL), p.SLLB05
Main Authors: Beppu, Kosuke, Iida, Yosuke, Adachi, Hideaki, Fujii, Ichiro, Wada, Takahiro
Format: Article
Language:English
Subjects:
Antiferroelectricity
Calcium zirconate
Crystal structure
Crystals
Diffraction patterns
Electric fields
Electron diffraction
High temperature
Hysteresis loops
Mapping
Pulsed laser deposition
Pulsed lasers
Single crystals
Sodium compounds
Strontium titanates
Substrates
Thin films
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Summary:The present study demonstrates the antiferroelectric property of a 0.94NaNbO3-0.06CaZrO3 thin-film deposited on a SrRuO3 coated (001)SrTiO3 single crystal substrate fabricated by a pulsed laser deposition method. X-ray diffraction reciprocal space mapping and electron diffraction patterns show that the crystal structure of the 0.94NaNbO3-0.06CaZrO3 thin film has a fourfold super lattice structure of antiferroelectric NaNbO3. The 0.94NaNbO3-0.06CaZrO3 thin film shows an antiferroelectric double polarization-electric field (P-E) hysteresis loop. The hysteresis of the P-E response became clear with rising measurement temperature. Furthermore, the 0.94NaNbO3-0.06CaZrO3 thin film exhibits antiferroelectrc behavior at a high temperature of 160 °C.
ISSN:0021-4922
1347-4065
DOI:10.7567/1347-4065/ab36ff