Abnormal Back Channel Leakage Under Large Drain Voltage in Short Channel Organic Thin-Film Transistors

This study investigates short channel (length

Saved in:
Bibliographic Details
Published in:IEEE electron device letters 2019-11, Vol.40 (11), p.1752-1755
Main Authors: Chen, Guan-Fu, Lin, Sung-Chun, Yu, Ming-Chang, Chuang, Yao-Chih, Zhang, Shengdong, Chen, Hong-Chih, Chang, Ting-Chang, Huang, Shin-Ping, Zhou, Kuan-Ju, Chen, Jian-Jie, Kuo, Chuan-Wei, Su, Wan-Ching, Tsao, Yu-Ching
Format: Article
Language:English
Subjects:
back channel leakage
dual gate
Electric potential
Electrodes
Leakage
Logic gates
Object recognition
Organic thin film transistors
OTFT
Semiconductor devices
Shareware
Substrates
Thin film transistors
Trade secrets
Voltage
Voltage control
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This study investigates short channel (length
ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2019.2942965