Facile fabrication and characterization of modified spray deposited cadmium sulphide thin films

• Published in: Physica. B, Condensed matter Condensed matter, 2019-10, Vol.571, p.64-70
• Main Authors: Shaikh, S.S., Shkir, Mohd, Masumdar, E.U.
• Format: Article
• Language: English
• Subjects: Cadmium; Cadmium sulfide; Cadmium sulphide (CdS); Crystal structure; Electrical properties; Electrical resistivity; Glass substrates; Grain size; Metal fabrication; Morphological properties; Optical properties; Organic chemistry; Raman spectra; Room temperature; Spray pyrolysis; Structural properties; Thickness; Thin films
• ISSN: 0921-4526; 1873-2135
• DOI: 10.1016/j.physb.2019.06.051

Herein we have deposited the Cadmium sulphide thin films chemically on glass substrates using modified spray pyrolysis technique, at 300 °C. The thickness of the deposited film was found to be 301 nm and the film was yellow in colour. Deposited CdS films were subjected to elemental, morphological, optical, structural and electrical studies. XRD analysis revealed that film was polycrystalline in nature and grain size was found to be 15 nm with the hexagonal crystal structure. The EDX analysis confirms the presence of S & Cd elements in film in the ratio 0.77. The morphological analysis showed the needle-shaped grains with an average grain size 43 nm. Raman spectra showed that all observed peaks correspond to the longitudinal optical phonon mode. The optical direct band gap value was found to be 2.43 eV. The room temperature electrical resistivity obtained was 2.2 × 106 Ω-cm. TEP studies revealed that film exhibits n-type conductivity. •CdS thin film of thickness ∼301 nm was prepared facilely on glass substrate at 300 °C using modified spray pyrolysis techniqu.•XRD analysis reveals that film was of hexagonal phase with polycrystalline nature and average crystallite size was found to be 15 nm.•The direct optical energy band gap was calculated to be 2.43 eV.