RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems

The recent trends for nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT) and autonomous systems, complex safety-critical applications, extreme miniaturization of implementation technologies and intensive interaction with the physical worl...

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Bibliographic Details
Published in:arXiv.org 2019-11
Main Authors: Jenihhin, Maksim, Hamdioui, Said, Matteo Sonza Reorda, Krstic, Milos, Langendoerfer, Peter, Sauer, Christian, Klotz, Anton, Huebner, Michael, Nolte, Joerg, Heinrich Theodor Vierhaus, Selimis, Georgios, Alexandrescu, Dan, Taouil, Mottaqiallah, Geert-Jan Schrijen, Raik, Jaan, Sterpone, Luca, Squillero, Giovanni, Dyka, Zoya
Format: Article
Language:English
Subjects:
Electronic design automation
Error analysis
Fault tolerance
Interdisciplinary aspects
Internet of Things
Miniaturization
Reliability analysis
Safety critical
Security
Time management
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Summary:The recent trends for nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT) and autonomous systems, complex safety-critical applications, extreme miniaturization of implementation technologies and intensive interaction with the physical world. These set tough requirements on mutually dependent extra-functional design aspects. The H2020 MSCA ITN project RESCUE is focused on key challenges for reliability, security and quality, as well as related electronic design automation tools and methodologies. The objectives include both research advancements and cross-sectoral training of a new generation of interdisciplinary researchers. Notable interdisciplinary collaborative research results for the first half-period include novel approaches for test generation, soft-error and transient faults vulnerability analysis, cross-layer fault-tolerance and error-resilience, functional safety validation, reliability assessment and run-time management, HW security enhancement and initial implementation of these into holistic EDA tools.
ISSN:2331-8422