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Method for Determining the Most Sensitive Region of an Optocoupler Chip under X-ray-Induced Dose Effects

This paper is devoted to analyzing the effect of gamma radiation on the behavior of optocouplers. According to a series of experiments that involve masking various parts of a chip from X-ray irradiation, the most sensitive region of the chip is determined and the design of the optocoupler is improve...

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Bibliographic Details
Published in:Russian microelectronics 2019-11, Vol.48 (6), p.415-421
Main Authors: Chernyak, M. E., Ranneva, E. V., Ulanova, A. V., Nikiforov, A. Yu, Verizhnikov, A. I., Tsyrlov, A. M., Fedosov, V. S., Shchepanov, A. N., Kalashnikov, V. D., Titovets, D. O.
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Language:English
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Summary:This paper is devoted to analyzing the effect of gamma radiation on the behavior of optocouplers. According to a series of experiments that involve masking various parts of a chip from X-ray irradiation, the most sensitive region of the chip is determined and the design of the optocoupler is improved. Upon modification, the radiation hardness of the device more than triples.
ISSN:1063-7397
1608-3415
DOI:10.1134/S1063739719060039