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Method for Determining the Most Sensitive Region of an Optocoupler Chip under X-ray-Induced Dose Effects
This paper is devoted to analyzing the effect of gamma radiation on the behavior of optocouplers. According to a series of experiments that involve masking various parts of a chip from X-ray irradiation, the most sensitive region of the chip is determined and the design of the optocoupler is improve...
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Published in: | Russian microelectronics 2019-11, Vol.48 (6), p.415-421 |
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Main Authors: | , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites |
Online Access: | Get full text |
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Summary: | This paper is devoted to analyzing the effect of gamma radiation on the behavior of optocouplers. According to a series of experiments that involve masking various parts of a chip from X-ray irradiation, the most sensitive region of the chip is determined and the design of the optocoupler is improved. Upon modification, the radiation hardness of the device more than triples. |
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ISSN: | 1063-7397 1608-3415 |
DOI: | 10.1134/S1063739719060039 |