Influence of composition and nanogranular structure of (Co+Fe+Zr)/(ZrO) composite films on conductivity and microwave reflective properties

A comparative study were carried out on composition, nanostructure and conductivity of (Co + Fe + Zr)/(ZrO) amorphous granular composite films deposited on polyethylene terephthalate substrate by ion beam deposition in argon and nitrogen atmosphere. Atomic force microscopy, magnetic force microscopy...

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Bibliographic Details
Published in:Materials chemistry and physics 2020-01, Vol.240, p.122097, Article 122097
Main Authors: Antonets, Igor V., Kotov, Leonid N., Golubev, Yevgeny A.
Format: Article
Language:English
Subjects:
Argon
Atomic force microscopy
Cobalt
Comparative studies
Composition
Conductivity
Film thickness
Granular materials
Ion beams
Iron
Magnetic fields
Magnetic structure
Metallic glasses
Microscopy
Microwave reflective properties
Nanogranular structure
Percolation
Polyethylene terephthalate
Reflectance
Substrates
Thin composite films
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Summary:A comparative study were carried out on composition, nanostructure and conductivity of (Co + Fe + Zr)/(ZrO) amorphous granular composite films deposited on polyethylene terephthalate substrate by ion beam deposition in argon and nitrogen atmosphere. Atomic force microscopy, magnetic force microscopy, energy dispersive analysis and scanning electron microscopy were used. It is shown that the content of the metal phase in the films determines both the average granule sizes and their microwave reflecting and conducting properties. Dependences of granules size, reflection coefficient and conductivity on the metal phase content and film thickness were found. The influence of the metallic phase turns out to be significant in the presence of percolation (flow) processes that arise when the films are deposited. •Metallic-phase content has a key effect on the microwave reflection from the films.•Influence of the effective layer of films metallic phase on reflection was evaluated.•Percolation processes in composite films with magnetic properties connected.
ISSN:0254-0584
1879-3312
DOI:10.1016/j.matchemphys.2019.122097