Effects of the buffer layer on piezoelectric and ferroelectric properties of PMN-PT film-on-Ni foil composites

With the ever increasing requirements for the structural health monitoring systems, the deposition of the piezoelectric films on the metallic or structural materials has turned out to be an important issue. Pb(Mg, Nb)O 3 -PbTiO 3 films with different buffer layers, i.e., in situ NiO, pre-fabricated...

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Bibliographic Details
Published in:Journal of materials science. Materials in electronics 2020, Vol.31 (1), p.677-683
Main Authors: Wang, Jing, Shen, Bowen, Zhu, Kongjun, Qiu, Jinhao
Format: Article
Language:English
Subjects:
Aeronautics
Aerospace engineering
Annealing
Buffer layers
Characterization and Evaluation of Materials
Chelating agents
Chemistry and Materials Science
Crystal structure
Deposition
Diffusion layers
Ferroelectric materials
Ferroelectricity
Interfaces
Lanthanum oxides
Lead titanates
Magnetic fields
Materials Science
Metal foils
Monitoring systems
Nickel oxides
Nucleation
Optical and Electronic Materials
Organic chemistry
Perovskites
Piezoelectric films
Piezoelectricity
Structural health monitoring
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Summary:With the ever increasing requirements for the structural health monitoring systems, the deposition of the piezoelectric films on the metallic or structural materials has turned out to be an important issue. Pb(Mg, Nb)O 3 -PbTiO 3 films with different buffer layers, i.e., in situ NiO, pre-fabricated NiO and LaNiO 3 , were successfully deposited on the Ni foil via the chemical solution deposition. The crystal structures and electric performances showed evident dependence on the buffer layer. Pre-deposited NiO and LaNiO 3 efficiently prevented the diffusion and complex reactions occurring at the interface, offered abundant nucleation sites, and thus helped the formation of pure high-qualified perovskite PMN-PT films at higher annealing temperatures.
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-019-02574-5