The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis

This work proposes a methodology to diagnose radiation-induced faults in a microprocessor using the hardware trace infrastructure. The diagnosis capabilities of this approach are demonstrated for an ARM microprocessor under neutron and proton irradiation campaigns. The experimental results demonstra...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on nuclear science 2020-01, Vol.67 (1), p.126-134
Main Authors: Pena-Fernandez, M., Lindoso, A., Entrena, L., Garcia-Valderas, M.
Format: Article
Language:English
Subjects:
ARM
Circuit faults
Fault diagnosis
fault tolerance
Hardware
Irradiation
microprocessor trace
Microprocessors
Pins
Proton irradiation
Radiation
Radiation effects
single-event effects
Testing
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This work proposes a methodology to diagnose radiation-induced faults in a microprocessor using the hardware trace infrastructure. The diagnosis capabilities of this approach are demonstrated for an ARM microprocessor under neutron and proton irradiation campaigns. The experimental results demonstrate that the execution status in the precise moment that the error occurred can be reconstructed, so that error diagnosis can be achieved.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2019.2956204