Determination of the Mass Absorption Coefficient in Two-Layer Cr/Co Thin Film Systems by the X-Ray Fluorescence Method

XRF procedure to determine the mass absorption coefficient in Cr/Co two-layer systems has been proposed. The procedure uses easy-to-make thin-fi lm layers of sputtered chromium on a polymer fi lm substrate. Correction coefficients have been calculated that take into account the absorption of primary...

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Bibliographic Details
Published in:Journal of applied spectroscopy 2020, Vol.86 (6), p.1048-1052
Main Authors: Cherniaeva, E. A., Knyazeva, A. A., Zimina, E. O., Belyakova, I. S., Mashin, N. I.
Format: Article
Language:English
Subjects:
Absorptivity
Analysis
Analytical Chemistry
Atomic/Molecular Structure and Spectra
Chromium
Dielectric films
Electrical conductivity
Fluorescence
Methods
Physics
Physics and Astronomy
Substrates
Thin films
X ray tubes
X-ray fluorescence
X-ray spectroscopy
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Summary:XRF procedure to determine the mass absorption coefficient in Cr/Co two-layer systems has been proposed. The procedure uses easy-to-make thin-fi lm layers of sputtered chromium on a polymer fi lm substrate. Correction coefficients have been calculated that take into account the absorption of primary radiation of the X-ray tube and the absorption intensities of the analytical lines of a lower layer element in an upper layer.
ISSN:0021-9037
1573-8647
DOI:10.1007/s10812-020-00938-y