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Resistive Switching Studies of ReRAM Devices by In-Situ TEM

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Bibliographic Details
Published in:	Microscopy and microanalysis 2019-02, Vol.25 (S1), p.71-72
Main Authors:	Martín, Gemma, González, Mireia B., Varea, Aïda, Blázquez, Oriol, Vescio, Giovanni, Campabadal, Francesca, Hernández, Sergi, Cirera, Albert, Garrido, Blas, Estradé, Sònia, Peiró, Francesca, Cornet, Albert
Format:	Article
Language:	English
Subjects:	CISCEM 2018 - 4th Conference on In-Situ and Correlative Electron Microscopy October 10 - 12, 2018, Saarbrücken, Germany Materials Science (Posters)
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