Critical Current Degradation Behavior of Coated Conductor Subjected to Repeat Overcurrent

The performance degradation of superconducting equipment under repeat fault is a key issue for the operation of superconducting equipment in grid operation. The mechanism of the High Temperature Superconducting (HTS) tape performance degradation behavior is an important issue that need to be figured...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2020-06, Vol.30 (4), p.1-6
Main Authors: Chen, Guilun, Ren, Li, Xu, Ying, Feng, Tangyao, Liang, Siyuan, Li, Xianhao, Li, Jingdong, Shi, Jing, Tang, Yuejin
Format: Article
Language:English
Subjects:
Conductors
Critical current density
Critical current density (superconductivity)
Current measurement
Degradation
degradation development
High temperature
layer separation
Life assessment
Overcurrent
Performance degradation
repeated overcurrent
Resistance
Superconducting films
Superconducting tapes
Superconductivity
YBCO
YBCO superconductors
Yttrium barium copper oxide
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Summary:The performance degradation of superconducting equipment under repeat fault is a key issue for the operation of superconducting equipment in grid operation. The mechanism of the High Temperature Superconducting (HTS) tape performance degradation behavior is an important issue that need to be figured out. Therefore, it's necessary to carry out the performance degradation study of HTS tape under repeat overcurrent. In this paper, considering overcurrent duration, a series of repeated overcurrent experiments were carried on YBCO tapes under 50 Hz sinusoidal alternating current. The degradation of critical current of YBCO tapes after repeat overcurrent was recorded. The critical current density of the YBCO tape was scanned to track sample's structural change during experiment. The mechanism of the degradation development of YBCO tapes after their first degradation was described. The research could provide a reference for the design of fault protection and life assessment of HTS devices.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2020.2967683