Investigation on EM radiations from interconnects in integrated circuits

Revised Jul 2, 2019 Accepted Jul 18, 2019 Keywords: Capacitance Electromagnetic Finite element method Interconnect Multiconductor Radiations Transmission lines ABSTRACT Characterization and estimation of interconnections behavior in integrated circuits design before the implementation phase is of pa...

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Bibliographic Details
Published in:Telkomnika 2020-02, Vol.18 (1), p.301-310
Main Authors: Belhimer, Lounas, Benfdila, Arezki, Lakhlef, Ahcene
Format: Article
Language:English
Subjects:
Capacitance
Circuit design
Circuit diagrams
Design
Electromagnetic interference
Equivalent circuits
Finite element analysis
Finite element method
Flux density
Inductance
Insulation
Integrated circuits
Interconnect
Mathematical analysis
Mathematical models
Matrix algebra
Matrix methods
Parameter identification
Partial differential equations
Propagation
Resistance
Substrates
Transmission lines
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Summary:Revised Jul 2, 2019 Accepted Jul 18, 2019 Keywords: Capacitance Electromagnetic Finite element method Interconnect Multiconductor Radiations Transmission lines ABSTRACT Characterization and estimation of interconnections behavior in integrated circuits design before the implementation phase is of paramount importance. [...]they become the preferred path for the propagation of electromagnetic disturbances. (29) [A] and [K] are respectively the unknown vector and the excitation source vector [M] and [L] are two matrices that depend on the mesh structure 4.PARAMETERS IDENTIFICATION OF THE EQUIVALENT CIRCUIT DIAGRAM It is important for an integrated circuit designer to predict the behavior of his product in an electromagnetic interference environment. The parameters of the equivalent diagram are: the equivalent inductance "L" per unit length, it characterizes the magnetic energy density stored in the medium, the equivalent capacitance "C" per unit length, it characterizes the density of dielectric energy stored in the substrate, the resistance series per unit length "R", it characterizes the losses by Joule effect, the parallel conductance per unit length "G", it characterizes the losses in the insulation.
ISSN:1693-6930
2302-9293
DOI:10.12928/telkomnika.v18i1.13130