Parallel phase shifting radial shear interferometry with complex fringes and unknown phase shift

We present an interferometric method to analyze transparent samples using complex fringes generated by a parallel phase shifting radial shear interferometer using two coupled interferometers. Parallel interferograms are generated using two interferometers: the first one generates the polarized base...

Full description

Saved in:
Bibliographic Details
Published in:Applied optics (2004) 2020-03, Vol.59 (7), p.2128
Main Authors: García-Lechuga, Luis, Pérez-Luna, Patricia, Flores, Victor H, Montes-Pérez, Areli, Quiroz-Rodríguez, Adolfo, Manuel Islas-Islas, Juan, Toto-Arellano, Noel-Ivan
Format: Article
Language:English
Subjects:
Algorithms
Amplitude modulation
Interferometry
Phase objects
Phase shift
Polarizers
Shear interferometers
Shear interferometry
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We present an interferometric method to analyze transparent samples using complex fringes generated by a parallel phase shifting radial shear interferometer using two coupled interferometers. Parallel interferograms are generated using two interferometers: the first one generates the polarized base pattern, and the second system is used to generate parallel interferograms allowing the adjustment of the - positions of the parallel interferograms. To obtain the optical phase map, parallel phase shift is generated by collocating polarizing filters at the output of the system; the polarizers are placed at arbitrary angles since they do not require adjustment because of the phase-recovery algorithm. The optical phase was processed using a two-step algorithm based on a modified Gram-Schmidt orthogonalization method. Such an algorithm has the advantage of not being iterative and is robust to amplitude modulation. The proposed method reduces the number of captures needed in phase-shifting interferometry. We applied the developed system to examine static and dynamics phase objects.
ISSN:1559-128X
2155-3165
DOI:10.1364/AO.385632