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In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression
The measurement of thin film mechanical properties free from substrate influence remains one of the outstanding challenges in nanomechanics. Here, a technique based on indentation of a supported film with a flat punch whose diameter is many times the initial film thickness is introduced. This geomet...
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Published in: | Journal of materials research 2020-03, Vol.35 (6), p.644-653 |
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container_title | Journal of materials research |
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creator | Brazil, Owen de Silva, Johann P. Chowdhury, Mithun Yoon, Heedong McKenna, Gregory B. Oliver, Warren C. Kilpatrick, Jason Pethica, John B. Cross, Graham L. W. |
description | The measurement of thin film mechanical properties free from substrate influence remains one of the outstanding challenges in nanomechanics. Here, a technique based on indentation of a supported film with a flat punch whose diameter is many times the initial film thickness is introduced. This geometry generates a state of confined uniaxial strain for material beneath the punch, allowing direct access to intrinsic stress versus strain response. For simple elastic–plastic materials, this enables material parameters such as elastic modulus, bulk modulus, Poisson’s ratio, and yield stress to be simultaneously determined from a single loading curve. The phenomenon of confined plastic yield has not been previously observed in thin films or homogeneous materials, which we demonstrate here for 170–470 nm thick polystyrene (PS), polymethyl-methacrylate (PMMA) and amorphous Selenium films on silicon. As well as performing full elastic-plastic parameter extraction for these materials at room temperature, we used the technique to study the variation of yield stress in PS to temperatures above the nominal glass transition of 100 °C. |
doi_str_mv | 10.1557/jmr.2020.42 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2383532656</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2383532656</sourcerecordid><originalsourceid>FETCH-LOGICAL-c298t-73457bb23a1a3316770daaf9453af3554dea73e0cbf4584c39c7dead6cfaf583</originalsourceid><addsrcrecordid>eNptkMtKxDAUhoMoOI6ufIGAS-2Y5tLLUgYvAwNuZh_SNhlT26TmtELf3pQR3Lg6nMP3_wc-hG5TskmFyB_bPmwooWTD6RlaUcJ5IhjNztGKFAVPaJnyS3QF0BKSCpLzFWp3DoMdJ9xrBVPQvXYj9gZXU_eJe99M3QRYuQbPVncNDhoG70AvyLFTADMeP6zDxnY94G-rcO2dsU43uFOzDnHthxgC6901ujCqA33zO9fo8PJ82L4l-_fX3fZpn9S0LMYkZ1zkVUWZShVjaZbnpFHKlFwwZZgQvNEqZ5rUleGi4DUr6zyemqw2yoiCrdHdqXYI_mvSMMrWT8HFj5Kygi0-RBap-xNVBw8QtJFDsL0Ks0yJXFzK6FIuLiWnkX440RApd9Thr_M__AeF8XgP</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2383532656</pqid></control><display><type>article</type><title>In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression</title><source>ABI/INFORM Global</source><source>Springer Link</source><creator>Brazil, Owen ; de Silva, Johann P. ; Chowdhury, Mithun ; Yoon, Heedong ; McKenna, Gregory B. ; Oliver, Warren C. ; Kilpatrick, Jason ; Pethica, John B. ; Cross, Graham L. W.</creator><creatorcontrib>Brazil, Owen ; de Silva, Johann P. ; Chowdhury, Mithun ; Yoon, Heedong ; McKenna, Gregory B. ; Oliver, Warren C. ; Kilpatrick, Jason ; Pethica, John B. ; Cross, Graham L. W.</creatorcontrib><description>The measurement of thin film mechanical properties free from substrate influence remains one of the outstanding challenges in nanomechanics. Here, a technique based on indentation of a supported film with a flat punch whose diameter is many times the initial film thickness is introduced. This geometry generates a state of confined uniaxial strain for material beneath the punch, allowing direct access to intrinsic stress versus strain response. For simple elastic–plastic materials, this enables material parameters such as elastic modulus, bulk modulus, Poisson’s ratio, and yield stress to be simultaneously determined from a single loading curve. The phenomenon of confined plastic yield has not been previously observed in thin films or homogeneous materials, which we demonstrate here for 170–470 nm thick polystyrene (PS), polymethyl-methacrylate (PMMA) and amorphous Selenium films on silicon. As well as performing full elastic-plastic parameter extraction for these materials at room temperature, we used the technique to study the variation of yield stress in PS to temperatures above the nominal glass transition of 100 °C.</description><identifier>ISSN: 0884-2914</identifier><identifier>EISSN: 2044-5326</identifier><identifier>DOI: 10.1557/jmr.2020.42</identifier><language>eng</language><publisher>Cham: Springer International Publishing</publisher><subject>Applied and Technical Physics ; Biomaterials ; Bulk modulus ; Deformation ; Diameters ; Film thickness ; Geometry ; In situ measurement ; Indentation ; Inorganic Chemistry ; Load ; Materials Engineering ; Materials research ; Materials Science ; Mechanical properties ; Modulus of elasticity ; Nanomechanics and Testing ; Nanotechnology ; Parameters ; Poisson's ratio ; Polymethyl methacrylate ; Polystyrene resins ; Room temperature ; Selenium ; Strain ; Substrates ; Thin films ; Yield strength ; Yield stress</subject><ispartof>Journal of materials research, 2020-03, Vol.35 (6), p.644-653</ispartof><rights>Materials Research Society 2020</rights><rights>Copyright © Materials Research Society 2020</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c298t-73457bb23a1a3316770daaf9453af3554dea73e0cbf4584c39c7dead6cfaf583</citedby><cites>FETCH-LOGICAL-c298t-73457bb23a1a3316770daaf9453af3554dea73e0cbf4584c39c7dead6cfaf583</cites><orcidid>0000-0002-9714-5374</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.proquest.com/docview/2383532656/fulltextPDF?pq-origsite=primo$$EPDF$$P50$$Gproquest$$H</linktopdf><linktohtml>$$Uhttps://www.proquest.com/docview/2383532656?pq-origsite=primo$$EHTML$$P50$$Gproquest$$H</linktohtml><link.rule.ids>314,780,784,11688,27924,27925,36060,44363,74895</link.rule.ids></links><search><creatorcontrib>Brazil, Owen</creatorcontrib><creatorcontrib>de Silva, Johann P.</creatorcontrib><creatorcontrib>Chowdhury, Mithun</creatorcontrib><creatorcontrib>Yoon, Heedong</creatorcontrib><creatorcontrib>McKenna, Gregory B.</creatorcontrib><creatorcontrib>Oliver, Warren C.</creatorcontrib><creatorcontrib>Kilpatrick, Jason</creatorcontrib><creatorcontrib>Pethica, John B.</creatorcontrib><creatorcontrib>Cross, Graham L. W.</creatorcontrib><title>In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression</title><title>Journal of materials research</title><addtitle>Journal of Materials Research</addtitle><description>The measurement of thin film mechanical properties free from substrate influence remains one of the outstanding challenges in nanomechanics. Here, a technique based on indentation of a supported film with a flat punch whose diameter is many times the initial film thickness is introduced. This geometry generates a state of confined uniaxial strain for material beneath the punch, allowing direct access to intrinsic stress versus strain response. For simple elastic–plastic materials, this enables material parameters such as elastic modulus, bulk modulus, Poisson’s ratio, and yield stress to be simultaneously determined from a single loading curve. The phenomenon of confined plastic yield has not been previously observed in thin films or homogeneous materials, which we demonstrate here for 170–470 nm thick polystyrene (PS), polymethyl-methacrylate (PMMA) and amorphous Selenium films on silicon. As well as performing full elastic-plastic parameter extraction for these materials at room temperature, we used the technique to study the variation of yield stress in PS to temperatures above the nominal glass transition of 100 °C.</description><subject>Applied and Technical Physics</subject><subject>Biomaterials</subject><subject>Bulk modulus</subject><subject>Deformation</subject><subject>Diameters</subject><subject>Film thickness</subject><subject>Geometry</subject><subject>In situ measurement</subject><subject>Indentation</subject><subject>Inorganic Chemistry</subject><subject>Load</subject><subject>Materials Engineering</subject><subject>Materials research</subject><subject>Materials Science</subject><subject>Mechanical properties</subject><subject>Modulus of elasticity</subject><subject>Nanomechanics and Testing</subject><subject>Nanotechnology</subject><subject>Parameters</subject><subject>Poisson's ratio</subject><subject>Polymethyl methacrylate</subject><subject>Polystyrene resins</subject><subject>Room temperature</subject><subject>Selenium</subject><subject>Strain</subject><subject>Substrates</subject><subject>Thin films</subject><subject>Yield strength</subject><subject>Yield stress</subject><issn>0884-2914</issn><issn>2044-5326</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>M0C</sourceid><recordid>eNptkMtKxDAUhoMoOI6ufIGAS-2Y5tLLUgYvAwNuZh_SNhlT26TmtELf3pQR3Lg6nMP3_wc-hG5TskmFyB_bPmwooWTD6RlaUcJ5IhjNztGKFAVPaJnyS3QF0BKSCpLzFWp3DoMdJ9xrBVPQvXYj9gZXU_eJe99M3QRYuQbPVncNDhoG70AvyLFTADMeP6zDxnY94G-rcO2dsU43uFOzDnHthxgC6901ujCqA33zO9fo8PJ82L4l-_fX3fZpn9S0LMYkZ1zkVUWZShVjaZbnpFHKlFwwZZgQvNEqZ5rUleGi4DUr6zyemqw2yoiCrdHdqXYI_mvSMMrWT8HFj5Kygi0-RBap-xNVBw8QtJFDsL0Ks0yJXFzK6FIuLiWnkX440RApd9Thr_M__AeF8XgP</recordid><startdate>20200330</startdate><enddate>20200330</enddate><creator>Brazil, Owen</creator><creator>de Silva, Johann P.</creator><creator>Chowdhury, Mithun</creator><creator>Yoon, Heedong</creator><creator>McKenna, Gregory B.</creator><creator>Oliver, Warren C.</creator><creator>Kilpatrick, Jason</creator><creator>Pethica, John B.</creator><creator>Cross, Graham L. W.</creator><general>Springer International Publishing</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>0U~</scope><scope>1-H</scope><scope>3V.</scope><scope>7SR</scope><scope>7WY</scope><scope>7WZ</scope><scope>7XB</scope><scope>87Z</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8FL</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>FRNLG</scope><scope>F~G</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>K60</scope><scope>K6~</scope><scope>KB.</scope><scope>L.-</scope><scope>L.0</scope><scope>M0C</scope><scope>PDBOC</scope><scope>PQBIZ</scope><scope>PQBZA</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>Q9U</scope><scope>S0W</scope><orcidid>https://orcid.org/0000-0002-9714-5374</orcidid></search><sort><creationdate>20200330</creationdate><title>In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression</title><author>Brazil, Owen ; de Silva, Johann P. ; Chowdhury, Mithun ; Yoon, Heedong ; McKenna, Gregory B. ; Oliver, Warren C. ; Kilpatrick, Jason ; Pethica, John B. ; Cross, Graham L. W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c298t-73457bb23a1a3316770daaf9453af3554dea73e0cbf4584c39c7dead6cfaf583</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Applied and Technical Physics</topic><topic>Biomaterials</topic><topic>Bulk modulus</topic><topic>Deformation</topic><topic>Diameters</topic><topic>Film thickness</topic><topic>Geometry</topic><topic>In situ measurement</topic><topic>Indentation</topic><topic>Inorganic Chemistry</topic><topic>Load</topic><topic>Materials Engineering</topic><topic>Materials research</topic><topic>Materials Science</topic><topic>Mechanical properties</topic><topic>Modulus of elasticity</topic><topic>Nanomechanics and Testing</topic><topic>Nanotechnology</topic><topic>Parameters</topic><topic>Poisson's ratio</topic><topic>Polymethyl methacrylate</topic><topic>Polystyrene resins</topic><topic>Room temperature</topic><topic>Selenium</topic><topic>Strain</topic><topic>Substrates</topic><topic>Thin films</topic><topic>Yield strength</topic><topic>Yield stress</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Brazil, Owen</creatorcontrib><creatorcontrib>de Silva, Johann P.</creatorcontrib><creatorcontrib>Chowdhury, Mithun</creatorcontrib><creatorcontrib>Yoon, Heedong</creatorcontrib><creatorcontrib>McKenna, Gregory B.</creatorcontrib><creatorcontrib>Oliver, Warren C.</creatorcontrib><creatorcontrib>Kilpatrick, Jason</creatorcontrib><creatorcontrib>Pethica, John B.</creatorcontrib><creatorcontrib>Cross, Graham L. W.</creatorcontrib><collection>CrossRef</collection><collection>Global News & ABI/Inform Professional</collection><collection>Trade PRO</collection><collection>ProQuest Central (Corporate)</collection><collection>Engineered Materials Abstracts</collection><collection>Access via ABI/INFORM (ProQuest)</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central</collection><collection>Business Premium Collection (Alumni)</collection><collection>ABI/INFORM Global (Corporate)</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>ProQuest Business Collection (Alumni Edition)</collection><collection>ProQuest Business Collection</collection><collection>https://resources.nclive.org/materials</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ABI/INFORM Professional Standard</collection><collection>ABI/INFORM Global</collection><collection>Materials science collection</collection><collection>ProQuest One Business</collection><collection>ProQuest One Business (Alumni)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central Basic</collection><collection>DELNET Engineering & Technology Collection</collection><jtitle>Journal of materials research</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Brazil, Owen</au><au>de Silva, Johann P.</au><au>Chowdhury, Mithun</au><au>Yoon, Heedong</au><au>McKenna, Gregory B.</au><au>Oliver, Warren C.</au><au>Kilpatrick, Jason</au><au>Pethica, John B.</au><au>Cross, Graham L. W.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression</atitle><jtitle>Journal of materials research</jtitle><stitle>Journal of Materials Research</stitle><date>2020-03-30</date><risdate>2020</risdate><volume>35</volume><issue>6</issue><spage>644</spage><epage>653</epage><pages>644-653</pages><issn>0884-2914</issn><eissn>2044-5326</eissn><abstract>The measurement of thin film mechanical properties free from substrate influence remains one of the outstanding challenges in nanomechanics. Here, a technique based on indentation of a supported film with a flat punch whose diameter is many times the initial film thickness is introduced. This geometry generates a state of confined uniaxial strain for material beneath the punch, allowing direct access to intrinsic stress versus strain response. For simple elastic–plastic materials, this enables material parameters such as elastic modulus, bulk modulus, Poisson’s ratio, and yield stress to be simultaneously determined from a single loading curve. The phenomenon of confined plastic yield has not been previously observed in thin films or homogeneous materials, which we demonstrate here for 170–470 nm thick polystyrene (PS), polymethyl-methacrylate (PMMA) and amorphous Selenium films on silicon. As well as performing full elastic-plastic parameter extraction for these materials at room temperature, we used the technique to study the variation of yield stress in PS to temperatures above the nominal glass transition of 100 °C.</abstract><cop>Cham</cop><pub>Springer International Publishing</pub><doi>10.1557/jmr.2020.42</doi><tpages>10</tpages><orcidid>https://orcid.org/0000-0002-9714-5374</orcidid></addata></record> |
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subjects | Applied and Technical Physics Biomaterials Bulk modulus Deformation Diameters Film thickness Geometry In situ measurement Indentation Inorganic Chemistry Load Materials Engineering Materials research Materials Science Mechanical properties Modulus of elasticity Nanomechanics and Testing Nanotechnology Parameters Poisson's ratio Polymethyl methacrylate Polystyrene resins Room temperature Selenium Strain Substrates Thin films Yield strength Yield stress |
title | In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T10%3A36%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=In%20situ%20measurement%20of%20bulk%20modulus%20and%20yield%20response%20of%20glassy%20thin%20films%20via%20confined%20layer%20compression&rft.jtitle=Journal%20of%20materials%20research&rft.au=Brazil,%20Owen&rft.date=2020-03-30&rft.volume=35&rft.issue=6&rft.spage=644&rft.epage=653&rft.pages=644-653&rft.issn=0884-2914&rft.eissn=2044-5326&rft_id=info:doi/10.1557/jmr.2020.42&rft_dat=%3Cproquest_cross%3E2383532656%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c298t-73457bb23a1a3316770daaf9453af3554dea73e0cbf4584c39c7dead6cfaf583%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2383532656&rft_id=info:pmid/&rfr_iscdi=true |