Determination of the Optical Properties and Electrical Characteristics of Solid and Liquid Ytterbium with Ellipsometric Measurements

An ellipsometric method is used to study the optical properties of unoxidized surfaces of polycrystalline ytterbium film in the spectral range of 0.4–2.6 mm. The measured refractive indices and absorption coeffi cient of the film are used to calculate the dispersion dependences of the optical conduc...

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Bibliographic Details
Published in:Journal of applied spectroscopy 2020-03, Vol.87 (1), p.134-142
Main Authors: Akashev, L. A., Popov, N. A., Shevchenko, V. G.
Format: Article
Language:English
Subjects:
Analysis
Analytical Chemistry
Atomic/Molecular Structure and Spectra
Electric properties
Electrical resistivity
Electronic properties
Electrons
Ellipsometry
Energy dissipation
Optical properties
Physics
Physics and Astronomy
Rare earth metals
Refractivity
Ytterbium
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Summary:An ellipsometric method is used to study the optical properties of unoxidized surfaces of polycrystalline ytterbium film in the spectral range of 0.4–2.6 mm. The measured refractive indices and absorption coeffi cient of the film are used to calculate the dispersion dependences of the optical conductivity σ reflectivity R, the imaginary and real parts of the dielectric constant ε 1 and ε 2 , and the characteristic electron energy loss functions Im(ε –1 ). The infrared measurements are used in a two-band model for the conductivity to calculate the electronic characteristics of ytterbium in the solid and liquid states.
ISSN:0021-9037
1573-8647
DOI:10.1007/s10812-020-00974-8